نتایج جستجو برای: depth calibration

تعداد نتایج: 215165  

2010
Miguel Palacios Martin Lettau Christine Parlour Nishanth Rajan Jacob Sagi Adam Szeidl Carles Vergara

This paper derives the value and the risk of aggregate human capital in a dynamic equilibrium production model with Duffie-Epstein preferences. In this setting the expected return of a risky asset is a function of the asset’s covariance with consumption growth and a weighted average of the asset’s covariance with aggregate wage growth and aggregate financial returns. A calibration of the model ...

Journal: :The Journal of neuroscience : the official journal of the Society for Neuroscience 2013
Robert Volcic Carlo Fantoni Corrado Caudek John A Assad Fulvio Domini

Perceptual judgments of relative depth from binocular disparity are systematically distorted in humans, despite in principle having access to reliable 3D information. Interestingly, these distortions vanish at a natural grasping distance, as if perceived stereo depth is contingent on a specific reference distance for depth-disparity scaling that corresponds to the length of our arm. Here we sho...

1999
Toni Schenk

Laser altimetry has, and is continuing to have a profound impact on photogrammetry. This paper discusses the interrelationship between the two fields, identifies problems, and suggests a common research agenda. Surface reconstruction is an important application in photogrammetry. DTMs, for example, are as much an end result as an intermediate step for orthophoto generation and for object recogn...

2014
B. Goswami J. Heitzig K. Rehfeld N. Marwan A. Anoop S. Prasad J. Kurths

Sedimentary proxy records constitute a significant portion of the recorded evidence that allows us to investigate paleoclimatic conditions and variability. However, uncertainties in the dating of proxy archives limit our ability to fix the timing of past events and interpret proxy record intercomparisons. While there are various age-modeling approaches to improve the estimation of the age–depth...

2004
Yong K. Kim Kent D. Choquette Judith E. Baker Andrew A. Allerman

Depth profile analysis by high-resolution secondary ion mass spectrometry ~SIMS! can accurately determine C and Si concentrations within monolithic reflectors of vertical cavity surface-emitting lasers ~VCSELs!. These SIMS depth profiles are quantified to atomic concentrations using relative sensitivity factors and calibration standards, and are correlated to the laser characteristics. We compa...

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