نتایج جستجو برای: eelectron microscopy
تعداد نتایج: 192289 فیلتر نتایج به سال:
We have constructed an atomic force microscope enabling one to image the topography of a sample, and to monitor simultaneously ultrasonic surface vibrations in the MHz range. For detection of the distribution of the ultrasonic vibration amplitude, a part of the position-sensing light beam reflected from the cantilever is directed to an external knife-edge detector. Acoustic images taken on the ...
Confocal fluorescence microscopy and atomic force microscopy (AFM) are two established techniques that can be used to study single molecules. Both techniques have their individual capabilities that permit to study different aspects such as topography using AFMs, or dynamics using fluorescence spectroscopy. Thus, a combination of both techniques into a single instrument enhances the methodology ...
چکیده ندارد.
نمودار تعداد نتایج جستجو در هر سال
با کلیک روی نمودار نتایج را به سال انتشار فیلتر کنید