نتایج جستجو برای: electron probe microanalysis epma

تعداد نتایج: 393918  

Journal: :Journal of Mining and Metallurgy, Section B 2021

Sb distribution in the phases of SiO2 saturated Sb-Fe-O-SiO2-CaO system was determined for first time through hightemperature experiment and quenching techniques, followed by Electron probe X-ray microanalysis (EPMA) air (Ptot = 1 atm, PO2 0.21 atm). The were quantified temperature range 900?C-1200?C effects Fe/SiO2 (mass fraction) CaO/SiO2 on Sb2O3 content investigated at 1200?C. results indic...

Journal: :Minerals 2023

A characterization study of chromite ore from South Africa was conducted using bulk assays, X-ray diffraction, optical, scanning electron microscopy (SEM), automated probe microanalysis (EPMA) and quantitative evaluation mineral by (QEMSCAN) mineralogical techniques, EPMA. The aim to identify all major gangue impurities, the degree liberation, possible beneficiation options. material assayed 40...

Journal: :Transactions of the Japan Institute of Metals 1975

Journal: :Journal of the Spectroscopical Society of Japan 1964

Journal: :Journal of the Japan Institute of Metals and Materials 1968

Journal: :Microscopy and Microanalysis 2021

Abstract

2011
Steve Wilson Alan Koenig Heather Lowers

Introduction The U.S. Geological Survey (USGS) has been producing reference materials since the 1950s [1]. Over 50 materials have been developed to cover bulk rock, sediment, and soils for the geological community. These materials are used globally in geochemistry, environmental, and analytical laboratories that perform bulk chemistry and/or microanalysis for instrument calibration and quality ...

2018
Yuan Zhang Jingyuan Li Huiying Lai Yuzhao Xu

The corrosion behaviors of Mg-2Zn-0.2Mn-xCa (denoted as MZM-xCa alloys) in homogenization state have been investigated by immersion test and electrochemical techniques in a simulated physiological condition. The microstructure features were characterized using scanning electron microscopy (SEM), X-ray diffraction (XRD), transmission electron microscopy (TEM) and electron probe microanalysis (EP...

2016
P. Willich

EPMA has been applied to electron beam evaporated and r.f. sputtered layers of about 200 tig/cm. This includes analysis of trapped argon and oxygen ranging from 0.2 to 10 wt%. For primary electron energies of 5 to 15 keV depth range of X-ray emission may be predicted with an accuracy of ± 10 nm. Errors of quantitative analysis are discussed for various correction models and should not exceed 3....

نمودار تعداد نتایج جستجو در هر سال

با کلیک روی نمودار نتایج را به سال انتشار فیلتر کنید