نتایج جستجو برای: field optical microscopy
تعداد نتایج: 1184779 فیلتر نتایج به سال:
Concurrent polarization retrieval Method in multi- heterodyne scanning near-field optical Microscopy
Scanning near-field optical microscopy (SNOM) is a popular tool to overcome the diffraction limit for the investigation of subwavelength-scale optical structures. For nearly 30 years, various configurations have been implemented to characterize the interactions of the electromagnetic field with nanostructures in the near field. An accurate understanding of these interactions requires a detailed...
Scanning Near-field Optical Microscopy (SNOM) is the leading instrument used to image optical fields on the nanometer scale. A metal-coating is typically applied to SNOM probes to define a subwavelength aperture and minimize optical leakage, but the presence of such coatings in the near field of the sample can often cause a substantial change in the sample emission properties. For the first tim...
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