نتایج جستجو برای: low power test

تعداد نتایج: 2290959  

Journal: :Integration 2011
Jia Li Xiao Liu Yubin Zhang Yu Hu Xiaowei Li Qiang Xu

Ever-increasing test data volume and excessive test power are two of the main concerns of VLSI testing. The ‘‘don’t-care’’ bits (also known as X-bits) in given test cube can be exploited for test data compression and/or test power reduction, and these techniques may contradict to each other because the very same X-bits are likely to be used for different optimization objectives. This paper prop...

Journal: :journal of teaching language skills 2013
sohila tahmasebi morteza yamini

critical language assessment (cla) argues that language testing is a form of social practice and an agent of cultural, social, educational as well as ideological agendas. as such this article scrutinized the power that different groups of people including, teachers, students and their parents own at the levels of developing, administrating and interpreting iranian university entrance examinatio...

2010
Priyadharshini Shanmugasundaram Vishwani D. Agrawal Adit D. Singh James B. Davis

As circuit sizes increase with scale down in technology, the time required to test the circuits also increases. Expensive automatic test equipment (ATE) is used to test these circuits and the cost of testing becomes a significant fraction of the total cost of the chip. Testing cost of a chip is directly related to the time its testing takes. However, test time cannot be reduced by simply applyi...

ژورنال: بیهوشی و درد 2019

 Aims and background:  The aim of this study was to investigate the effects of rehabilitation period with elastic training on frequency spectrum of foot forces in females with low back pain during walking. Materials and methods: The sample of this study included 20 girls with low back pain.The experimental group did elastic gait training for 6 weeks. Peak plantar forces during both pre and post...

پایان نامه :وزارت علوم، تحقیقات و فناوری - پژوهشگاه فرهنگ و اندیشه اسلامی 1382

چکیده ندارد.

Journal: :Journal of Physics: Conference Series 2005

Electrical Arc Furnace (EAF) is large, nonlinear and time-varying load that affects power quality of the power system by producing many problems such as harmonics, flicker, current unbalance and low power factor. This paper proposes a modified Unified Power Quality Conditioner (UPQC) to reduce power quality problems of EAF and enhance its controllability. Harmonic reduction, power quality impro...

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