With the progress of semiconductor process miniaturization, delay degradation by aging increases and threatens reliability fabricated chips. The amount is known to be circuit workload dependent, but previous evaluations are based on simulations, measurement real under realistic has not been reported yet. authors have already proposed a method, which can achieve enough accuracy measure dependent...

Abstract Correlations play a significant role in data analysis and the evaluation expression of uncertainty, yet estimating them is often difficult. This paper provides examples how to infer measurand value, given only uncertainties correlation ranges measurement results. The least informative data-distribution not Gaussian, but marginal distributions are. Explicit results are case pair, where ...