نتایج جستجو برای: probe sonicator

تعداد نتایج: 93440  

2012
Yun Zhou YuD Zhou

Spin-dependent Electron Transport in NanomagneticThin Film Devices

2013
Shoubhik Gupta

4) Briefly describe any new skills you acquired during your summer research: i) I have gained hands-on experience on the fabrication of nano-scale devices in the cleanroom. ii) I Learnt the use of software tools such as Mathematica for modeling and L-Edit for device layout. iii) I learnt to use Cascade 11000 Probe Station and IPE Probe Station for the electrical characterization of fabricated t...

Journal: :Vision Research 2006
Elliot D. Freeman Jon Driver

Two ambiguous transparent structure-from-motion (SFM) stimuli often appear to co-rotate. Grossmann & Dobbins (2003) reported breakdown of such perceptual coupling when one stimulus was made unambiguous (by rendering it opaque), leading them to propose that coupling depends generally on differential stimulus ambiguity. In contrast, we demonstrate robust stimulus-driven coupling even when one SFM...

Journal: :Physical review. E, Statistical, nonlinear, and soft matter physics 2010
Guoxin Cao Namas Chandra

Viscoelastic mechanical properties of biological cells are commonly measured using atomic force microscope (AFM) dynamic indentation with spherical tips. A semiempirical analysis based on numerical simulation is built to determine the cell mechanical properties. It is shown that the existing analysis cannot reflect the accurate values of cell elastic/dynamic modulus due to the effects of substr...

2017
Hyelee Lee

.........................................................................................iii ACKNOWLEDGEMENTS........................................................................v LIST OF FIGURES ................................................................................viii CHAPTER

Journal: :Physical review. E, Statistical, nonlinear, and soft matter physics 2002
H Schiessel G Oshanin A M Cazabat M Moreau

We study long-range morphological changes in atomic monolayers on solid substrates induced by different types of defects; e.g., by monoatomic steps in the surface, or by the tip of an atomic force microscope (AFM), placed at some distance above the substrate. Representing the monolayer in terms of a suitably extended Frenkel-Kontorova-type model, we calculate the defect-induced density profiles...

Journal: :Kobunshi 2005

Journal: :Canadian Journal of Communication 2019

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