In this paper, we propose a novel hardened latch to mitigate the SEU. The combination of the circuit structure and layout placement is adopted to enhance the multiple nodes upset tolerance. This latch consists of a normal D latch and a typical DICE latch. Different from the TMR latch, this latch can mitigate the charge collection on two transistors. HSPICE simulation results present that there ...

Due to aggressive technology scaling, radiation-induced soft errors have become a serious reliability concern in VLSI chip design. This paper presents a novel radiation hardened by design latch with high single-eventupset (SEU) immunity. The proposed latch can effectively mitigate SEU by internal dual interlocked scheme. The propagation delay, power dissipation and power delay product of the pr...

A single event causing a double-node upset is likely to occur in nanometric complementary metal-oxide-semiconductor (CMOS). Contemporary hardened latch designs are insufficient meeting high reliability, low power consumption, and delay. This paper presents novel soft error latch, known as loop interlocked (LIHL). consists of four modified cross-coupled elements, based on dual storage cell (DICE...

In flowering plants the gynoecium is the female reproductive structure. In Arabidopsis thaliana ovules initiate within the developing gynoecium from meristematic tissue located along the margins of the floral carpels. When fertilized the ovules will develop into seeds. SEUSS (SEU) and AINTEGUMENTA (ANT) encode transcriptional regulators that are critical for the proper formation of ovules from ...

Multimeric protein complexes are required during development to regulate transcription and orchestrate cellular proliferation and differentiation. The Arabidopsis (Arabidopsis thaliana) SEUSS (SEU) gene encodes a transcriptional adaptor that shares sequence similarity with metazoan Lim domain-binding transcriptional adaptors. In Arabidopsis, SEU forms a physical complex with the LEUNIG transcri...