The current generation of noisy intermediate-scale quantum computers introduces new opportunities to study many-body systems. In this paper, we show that circuits can provide a dramatically more efficient representation than classical numerics the states generated under nonequilibrium dynamics. For circuits, perform both real- and imaginary-time evolution using an optimization algorithm is feas...

the most common type of childhood-onset epilepsy syndrome is childhood absence epilepsy (cae) with well-defined electro clinical features but unknown pathological basis. the incidence of absence epilepsy is about 2 and 8 out of every 100 000 children up to the age of 16, and the prevalence is 2 and 10% of children with any form of epilepsy. children with cae suffer from high rate of pretreatmen...

Research problems in ICT networks often comprise coordination problems of information infrastructures and require state-of-the-art methods of coping with complex system dynamics. Especially, relevant economic network analysis is increasingly challenged to transcend “reductionist economic agendas” and incorporate findings from other disciplines. Recent trends of trying to bridge existing theoret...

The paper presents three procedures for the sensitivity analysis using auxiliary circuits: the Bykhovsky Perkins Cruz’s method, the incrementalcircuit approach and the adjoint-circuit approach. All methods, based on the auxiliary circuits, have needed an efficient partially-symbolic method for the circuit analysis. For this, it was elaborated a very good procedure for the partially-symbolic ana...

In recent years, Defect Oriented Testing (DOT) has been investigated as an alternative testing method for analog circuits. In this paper, we propose a wavelet transform based dynamic supply current (IDD) analysis technique for detecting catastrophic and parametric faults in analog circuits. Wavelet transform has the property of resolving events in both time and frequency domain simultaneously u...

This paper presents a switch-level test generation system for synchronous sequential circuits in which a new algorithm for switch-level test generation and an existing fault simulator are integrated. For test generation, a switch-level circuit is modeled as a logic network that correctly models all aspects of switch-level behavior. The time-frame based algorithm uses asynchronous processing wit...

| In this paper dynamic exponent-based electronics is introduced as a good candidate for overcoming some of the limitations of classic linear-based electronics. However, the use of the exponential relation as a primitive for the synthesis of electronic circuits implies that we have to deal with analysis and synthesis of dynamic nonlinear circuits. The linear time-varying approximation appears t...

power electronic converters are non-linear time-dependent systems whose exact analysis without the use of computers is very difficult, and even using computer softwares requires a long time. use of the state space averaging method, as will be mentioned, in addition to simplifying the analysis procedure which is a result of converting a time-dependent system to a time-independent one, reduces th...

SEARCH ALGORITHMS FOR SATISFIABILITY PROBLEMS IN COMBINATIONAL SWITCHING CIRCUITS by João Paulo Marques da Silva Chair: Karem A. Sakallah A number of tasks in computer-aided analysis of combinational circuits, including test pattern generation, timing analysis, delay fault testing and logic verification, can be viewed as particular formulations of the satisfiability problem (SAT). The first pur...

Algorithms to locate multiple design errors using region-based model are studied for both combinational and sequential circuits. The model takes locality aspect of errors and is based on a 3-value, non-enumerative analysis technique. Studies show the effectiveness of the region based model for gate connection and gate substitution errors. For sequential circuits, we try to locate the time frame...