نتایج جستجو برای: 46 for testing

تعداد نتایج: 10456336  

Journal: :Molecular ecology 2011
Lyanne Brouwer Martijn Van De Pol Els Atema Andrew Cockburn

In cooperative breeders, the tension between the opposing forces of kin selection and kin competition is at its most severe. Although philopatry facilitates kin selection, it also increases the risk of inbreeding. When dispersal is limited, extra-pair paternity might be an important mechanism to avoid inbreeding, but evidence for this is equivocal. The red-winged fairy-wren is part of a genus o...

2009
Marco Pollanen Michael Reynolds

Many science and engineering courses contain substantial mathematical content. In addition, the rapid development of online learning, in both traditional and Web-based courses, and the ubiquitous presence of laptop computing, is placing increased demands on students to enter mathematical expressions into a computer. Furthermore, it is often required that the expressions are written in real-time...

2018

Attempts to commercialize GaN VCSELs have been unsuccessful to date due to the challenges of manufacturability of DBR mirrors, difficulties associated with current blocking, and the complexity of laser liftoff. The new process flow overcomes all three challenges enabling the manufacturing of IIINitride VCSEL without liftoff and with much reduced complexity and the possibility of on-wafer testing.

2013
Abir Al Hajri Gregor Miller Sidney S. Fels Matthew Fong

We describe a new video interface based on a recorded personal navigation history which provides simple mechanisms to quickly find and watch previously viewed intervals, highlight segments of video the user found interesting and support other video tasks such as crowd-sourced video popularity measures and consumer-level video editing. Our novel history interface lets users find previously viewe...

Journal: :IEEE Trans. on CAD of Integrated Circuits and Systems 1999
Sanghyeon Baeg William A. Rogers

Clock line control (CLC) is proposed as a new design for testability technique which can transform a complex test generation problem into many small ones that are efficiently manageable by selectively enabling or disabling the synchronous operation of modules. A novel sequential test generation technique for the circuits with CLC scheme is also presented. The new test generation methodology is ...

1999
Bernd Baumgarten Olaf Henniger

Testability and design for testability are widely discussed practical issues in software engineering, especially in protocol engineering. A number of basic testability qualities were defined formally and independently from any special system model. In this paper we refine these notions on the one hand by a containment order on experiments and on the other hand by a formal distinction between bo...

2007
Emmanuel Mulo

Building reliable software is becoming more and more important considering that software applications are becoming pervasive in our daily lives. The need for more reliable software requires that, amongst others, it is adequately tested to give greater confidence in its ability to perform as expected. However, testing software becomes a tedious task as the size and complexity of software increas...

2018

Attempts to commercialize GaN VCSELs have been unsuccessful to date due to the challenges of manufacturability of DBR mirrors, difficulties associated with current blocking, and the complexity of laser liftoff. The new process flow overcomes all three challenges enabling the manufacturing of IIINitride VCSEL without liftoff and with much reduced complexity and the possibility of on-wafer testing.

2005
Jun Zhou Hans-Joachim Wunderlich

Software-basierender Selbsttest (SBST) von Prozessoren wird schon seit Jahrzehnten verwendet, da er erhebliche Vorteile bietet, wie z. B. die Wiederverwendbarkeit in allen Stadien des Lebenszykluses des Systems, der Verzicht auf kostspielige Tester und geringe oder sogar gar kein Aufwand für „Design for Test“. Die größten Nachteile sind die unzureichende strukturelle Fehlerabdeckung sowie relat...

2014
Mukesh Agrawal

Optimization of Test and Design-for-Testability Solutions for Many-Core System-on-Chip Designs

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