نتایج جستجو برای: analog testing
تعداد نتایج: 388983 فیلتر نتایج به سال:
The paper proposes the realization of a Fuzzy Logic Temperature Controller. In this paper an analysis of Fuzzy Logic Controller is made and a temperature controller using MATLAB is developed. Here we used Fuzzy Logic Toolbox which is very useful software for development and testing of Fuzzy Logic system. It can be very quickly implemented and its visual impact is very encouraging. In this contr...
This paper presents significant improvements in the generation of analog signals for on-chip analog circuit testing. In particular, the novel oscillators proposed here can achieve signal-to-noise ratios far greater than previous designs, while remaining area-efficient. One particular example illustrates a 30 dB improvement in the SNR. Alternatively, signals can be generated with the same SNR as...
The paper describes solutions, how to improve a quality of basic testing methods to be possible to use them for dynamic testing high-resolution / middle speed AD converters and AD modules. The following methods are described: an application of low-distortion band pass filters, a digital correction of a known distortion of a testing signal, an application of a two-tone (or multitone) signal, an ...
Testing of high-speed Digital-to-Analog Converters (DACs) is a challenging task, as it requires large number of high-speed synchronized input signals with specific test patterns. To overcome this problem, we propose use of PRBS signals with an “Alternate-Bit-Tapping” technique and eye-diagram measurement as a solution to efficiently generate the testvectors and test the DACs. This approach cove...
Abstract The tasks of creation and development cyber-physical systems are considered. Cybernetic physical subsystems can be presented in digital analog form. subsystem that simulates nature is an Physical processes, both natural, particular, technogenic, behave like “things themselves.” Therefore, the processes synchronization with cybernetics often difficult to formalize or not performed corre...
This work evaluates the ability of OBT for detecting parametric faults in continuous-time filters. To this end, we adopt two filters with quite different topologies as cases of study and a previously reported statistical fault model. In addition, we explore the behavior of the test schemes when a particular test condition is changed. The new data reported here, obtained from a fault simulation ...
With the increased sophistication of System-on-Chip (SOC) architectures comes an increased need for low power Analog to Digital converters. These converters have many uses including Built-in-Self-Test (BIST) applications. In this paper, we present a novel Successive Approximation ADC. We show how one can utilize an existing DAC structure on an SOC to realize an effective Analog-to-Digital conve...
With the advanced scaling of CMOS technology in the nanometer range, highly integrated mixed-signal systems can be designed. The use of nanometer CMOS, however, poses many challenges. This keynote presentation gives an overview of problems due to increased variability and reliability. Both have to be addressed by the designer, either at IC design time or through reconfiguration at IC run time. ...
The novel digital-to-analog conversion technique studied in this paper, is founded on the digital duty-cycle modulation principle. It consists of a simple digital duty-cycle modulation program loaded in the flash memory of a microcontroller and an external analog low pass filter. Both pulse width and modulation period, simultaneously evolve according to the variation of the modulating input. Th...
This paper describes a high-speed, robust, scalable, and low-cost feed-forward time amplifier that uses phase detectors and variable delay lines. The amplifier works by detecting the time difference between two rising input edges with a phase detector and adjusting the delay of the variable delay line accordingly. A test chip was designed and fabricated in 65 nm CMOS. The measured resulting per...
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