نتایج جستجو برای: atomic emmision
تعداد نتایج: 91290 فیلتر نتایج به سال:
Nowadays, atomic-force microscopy plays a significant role in nanoscience and nanotechnology, and is widely used for direct measurement at atomic scale and scanning the sample surfaces. In tapping mode, the microcantilever of atomic-force microscope is excited at resonance frequency. Therefore, it is important to study its resonance. Moreover, atomic-force microscopes can be operated in fluid e...
Atomic Force Microscopy (AFM) techniques are used with oneor two-dimensional arrays of piezoresistive probes for parallel imaging. We present a newly designed AFM platform to drive these passivated piezoresistive cantilever arrays in air and liquid environments. Large area imaging in liquid as well as qualitative and quantitative analysis of biological cells are demonstrated by the means of pie...
The atomic force microscope (AFM) and its derivative technologies have heralded a new era in science and technology. AFM and related instruments were primarily designed by physicists. In recent years there is a substantial presence of engineers with controls and systems background who are contributing to AFM related technologies. This article provides a tutorial on the control and systems appro...
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