Diverse test sets are able to expose bugs that generated with structural coverage techniques cannot discover. Input-diverse set generators have been shown be effective for this, but also limitations: e.g., they need complemented semantic information derived from the Software Under Test. We demonstrate how drive generation process in form of output diversity. present first totally automatic samp...

Circuit partitioned approaches to ATPG have been developed and used over the last two decades, depending on the ratio between state-of-the-art in ATPG and circuit sizes. A practical form consists of coarse-grain, cone-oriented partitioning of the circuit. We investigated the problems introduced by practical ATPG constraints: keeping tests (3-state) bus-conflict free, and complying to external r...

State justi cation is one of the most timeconsuming tasks in sequential Automatic Test Pattern Generation (ATPG). For states that are diÆcult to justify, deterministic algorithms take signi cant CPU time without much success most of the time. In this work, we adopt a hybrid approach for state justication. A new method based on Genetic Algorithms is proposed, in which we engineer state justi cat...