This paper aims at providing a parameter estimation method for the machine tool reliability analysis to overcome the problem of unavailability of a well-defined failure data collection mechanism. It uses the knowledge and experience of maintenance personnel to obtain the parameters of lifetime distribution of the repairable as well as non-repairable components/ subassemblies. It is further deve...

Experiments are described in this paper whose results suggest a clear mathematical relationship between total circuit resistance (including the capacitor’s ESR) and the voltage at which a capacitor is likely to break down. Specifically, the relationship defines how much each capacitor’s (not precisely known) breakdown voltage is affected by changes in circuit resistance. Since a factor that str...

The reliability of power packs is very important for the performance of electronic equipment and ensuring the reliability of power electronic circuits is especially vital for equipment security. An alteration in the converter component parameter can lead to the decline of the power supply quality. In order to effectively prevent failure and estimate the remaining useful life (RUL) of superbuck ...

Kufluoglu, Haldun Ph.D., Purdue University, December, 2007. MOSFET Degradation due to Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) and Its Implications for Reliability-aware VLSI Design . Major Professor: Muhammad A. Alam. The scaling trends in CMOS technology and operating conditions give rise to serious degradation mechanisms such as Negative Bias Temperature I...

This article deals with modeling and design of a new fault-tolerant voter circuit. Majority voted redundancy is increasingly implemented in fault-tolerant design today. A voter is used in these implementations to determine a possibly correct result through the majority vote. The reliability of the voter circuit should be much higher than that of the other circuit elements; otherwise it will wip...

Please cite this article in press as: Han J et a doi:10.1016/j.microrel.2010.07.154 Logic circuits built using nanoscale technologies have significant reliability limitations due to fundamental physical and manufacturing constraints of their constituent devices. This paper presents a probabilistic gate model (PGM), which relates the output probability to the error and input probabilities of an ...

The thermo mechanical reliability of copper plated through holes (PTH) in printed circuit boards is normally determined by different tests e.g. thermo cycle test (TCT), interconnect stress test (IST) or highly accelerated thermal shock (HATS). During these tests the plated copper is exposed to stresses and strains which are below the tensile strength and the fracture strain, respectively, which...

The proposed circuit is a dual-chain Dickson type charge pump making use of both active and passive charge transfer switches in order to achieve a compromise between power efficiency, circuit complexity and device reliability. The charge pump is capable of sourcing up to 500 μA at 10 V output voltage for supplying the error amplifiers of two NMOS Low Drop Out (LDO) linear regulators as part of ...

 This paper presents a new design assistant for analog integrated circuits. The interactive tool is implemented in the Design Framework II of Cadence and supports the designer during circuit design. With the help of this new assistant analog designers can create ad hoc layouts of their circuits. These layouts are automatically extracted, and the updated netlist of the circuit is used for furth...