نتایج جستجو برای: fault coverage

تعداد نتایج: 148054  

2010
Matthew Staats Michael W. Whalen Ajitha Rajan Mats Per Erik Heimdahl

In black-box testing, the tester creates a set of tests to exercise a system under test without regard to the internal structure of the system. Generally, no objective metric is used to measure the adequacy of black-box tests. In recent work, we have proposed three requirements coverage metrics, allowing testers to objectively measure the adequacy of a black-box test suite with respect to a set...

2011
A. A. Chari

This paper deals with the Reliability analysis of K-out-of-n : G redundant system in the presence of Lethal & Non-lethal Common Cause Shock failures (CCS) along with imperfect fault coverage. S.Akhtar (1994) has discussed the reliability analysis of k-out-of-n: G redundant system with Perfect and imperfect fault coverage and derived Reliability measures namely Rs (t), As (t), MTTF, MTBF. K.Mall...

Journal: :IEEE Trans. on CAD of Integrated Circuits and Systems 2003
Yi Zhao Sujit Dey

This paper addresses the problem of evaluating the effectiveness of test sets to detect crosstalk defects in system-level interconnects and buses of deep submicron (DSM) chips. The fast and accurate estimation technique will enable: 1) evaluation of different existing tests, like functional, scan, logic built-in self-test (BIST), and delay tests, for effective testing of crosstalk defects in co...

2000
M.Blyzniuk T.Cibaková

A new fault model is developed for estimation of the coverage of physical defects in digital circuits for given test sets. Based on this model, a new hierarchical defect oriented fault simulation method is proposed. At the higher level simulation we use the functional fault model, at the lower level we use the defect/fault relationships in the form of defect coverage table and the conditional d...

1999
Peter Folkesson Johan Karlsson

The effects of variations in the workload input when estimating error detection coverage using fault injection are investigated. Results from scanchain implemented fault injection experiments using the FIMBUL tool on the Thor microprocessor show that the estimated error non-coverage may vary by more than five percentage units for different workload input sequences. A methodology for predicting ...

Madhu Jain Rakesh Kumar Meena

This study is concerned with the performance modeling of a fault tolerant system consisting of operating units supported by a combination of warm and cold spares. The on-line as well as warm standby units are subject to failures and are send for the repair to a repair facility having single repairman which is prone to failure. If the failed unit is not detected, the system enters into an unsafe...

Journal: :CoRR 2007
Andy Zaidman Bart Van Rompaey Serge Demeyer Arie van Deursen

Engineering software systems is a multidisciplinary activity, whereby a number of artifacts must be created — and maintained — synchronously. In this paper we investigate whether production code and the accompanying tests co-evolve by exploring a project’s versioning system, code coverage reports and size-metrics. Three open source case studies teach us that testing activities usually start lat...

Journal: :e-Informatica 2008
Philip Samuel Rajib Mall

We present a novel methodology for test case generation based on UML sequence diagrams. We create message dependence graphs (MDG) from UML sequence diagrams. Edge marking dynamic slicing method is applied on MDG to create slices. Based on the slice created with respect to each predicate on the sequence diagram, we generate test data. We formulate a test adequacy criterion named slice coverage c...

Journal: :IEEE Trans. Fuzzy Systems 2002
Mehrdad Nourani Amir Attarha Caro Lucas

Real defects (e.g., resistive stuck at or bridging faults) in the very large-scale integration (VLSI) circuits cause intermediate voltages which cannot be modeled as ideal shorts. In this paper, we first show that the traditional zero-resistance model is not sufficient for fault simulation. Then, we present a resistive fault model for real defects and use fuzzy logic techniques for fault simula...

2013
VIKAS PANTHI D. P. MOHAPATRA

Testing is one of the very important component of software development process. Properly generated test sequences may not only locate the defects in software, but also help in reducing the high cost associated with software testing. It is often desired that test sequences should be automatically generated to achieve required test coverage. Automatic test sequence generation is a major problem i...

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