نتایج جستجو برای: indentation depth
تعداد نتایج: 164927 فیلتر نتایج به سال:
The cubic silicon carbide (3C-SiC) has broad application prospects due to its excellent properties. modeling of damage in 3C-SiC contact loads is important yet challenging. In this paper, simulations based on peridynamics theory are proposed model indentation and scratching. indentation, the pop-in phenomenon load-depth curve initiation propagation cracks observed. During scratching, specific c...
For very shallow indentations in W, Al, Au, and Fe-3wt%Si single crystals, hardness decreased with increasing depth irrespective of increasing or decreasing strain gradients. As such, strain gradient theory appears insufficient to explain the indentation size effect (ISE) at depths less than several hundred nanometers. Present research links the ISE to a ratio between the energy of newly create...
The mechanical stiffness of individual cells is important in tissue homeostasis, cell growth, division and motility, and the epithelial-mesenchymal transition in the initiation of cancer. In this work, a normal squamous cell line (EPC2) and metaplastic (CP-A) as well as dysplastic (CP-D) Barrett's Esophagus columnar cell lines are studied as a model of pre-neoplastic progression in the human es...
The physics of industrial single-point force indentation hardness measurements (Vickers, Knoop, Brinell, Rockwell, Shore, Leeb, and others) is compared with the depth-sensing nano, micro, and macro instrumental hardness technique that provides several further mechanical parameters, when using the correct force/depth curves exponent 3/2 on the depth of the loading curves. Only the latter reveal ...
The mechanical properties of thin films can be measured by a variety of different techniques, with nanoindentation being one of the most recent developments in this growing field. By using a depthsensing indentation method it is possible to obtain quantitative values for the hardness and modulus, and thus gain better insight into the response of a material to controlled deformation at such smal...
We present a method for characterizing ultrathin films using sensitivity-enhanced atomic force acoustic microscopy, where a concentrated-mass cantilever having a flat tip was used as a sensitive oscillator. Evaluation was aimed at 6-nm-thick and 10-nm-thick diamond-like carbon (DLC) films deposited, using different methods, on a hard disk for the effective Young's modulus defined as E/(1 - ν(2)...
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