Pseudorandom number generation (PRNG) is the main security tool in low-cost passive radio-frequency identification (RFID) technologies, such as EPC Gen2. We present a lightweight PRNG design for low-cost passive RFID tags, named J3Gen. J3Gen is based on a linear feedback shift register (LFSR) configured with multiple feedback polynomials. The polynomials are alternated during the generation of ...

The 32-bit MAC of Grain-128a is a linear combination of the first 64 and then the alternative keystream bits. In this paper we describe a successful differential fault attack on Grain-128a, in which we recover the secret key by observing the correct and faulty MACs of certain chosen messages. The attack works due to certain properties of the Boolean functions and corresponding choices of the ta...

In order to reduce key sizes and bandwidth, several LFSRbased (linear feedback shift register) public key cryptosystems and signature schemes have been proposed. Digital signatures with message recovery are useful for many applications in which small messages (e.g., 100 bits or so) should be signed. This paper first presents a new sequence operation, called DSO, based on existing sequence opera...

This work shows how to efficiently construct binary de Bruijn sequences, even those with large orders, using the cycle joining method. The cycles are generated by an LFSR with a chosen period e whose irreducible characteristic polynomial can be derived from any primitive polynomial of degree n satisfying e = 2 n −1 t by t-decimation. The crux is our proof that determining Zech’s logarithms is e...

Power dissipation is a challenging problem for today’s system-on-chip design and test. This paper presents a novel architecture which generates the test patterns with reduced switching activities; it has the advantage of low test power and low hardware overhead. The proposed LP-TPG (test pattern generator) structure consists of modified low power linear feedback shift register (LP-LFSR), m-bit ...

The proposed Built-In Self-Diagnosis method (BISD) is based on the standard BIST architecture and can be integrated with recent, commercial DFT techniques, LP-TPG for in-field testing and in-field diagnostic data collection. To find maximum faults, structural diagnosis is used which does reveal the diagnostic information. A new low power test pattern generator using a linear feedback shift regi...

Error correction is one of the important technique for detecting and correcting errors in communication channels, memories etc. , Errors are associated with all types of memories. But the NAND FLASH memories are competing in the market due to its low power, high density, cost effectiveness and design scalability. As far as the memory is concerned the testing should not consume more time. So, so...

In a pseudo-random testing of combinational circuits the pattern generator produces test vectors that are being applied to the tested circuit. The nature of the generator thus directly influences the fault coverage achieved. In this paper we discuss an influence of the type of the pseudo-random pattern generator on the fault coverage. In most cases the LFSR is used as a pattern generator, while...