Abstract. High Energy solid state electron momentum spectroscopy (EMS) is capable of directly measuring spectral functions of ordered and disordered solid matter. In this paper we investigate the spectral functions for the group IV semiconductors Ge and Si. We attempt to resolve the electronic structure differences in amorphous, polycrystalline and crystalline atomic arrangements of the semicon...

X-ray Absorption Spectroscopy (XAS) is a well-established analytical technique used extensively for the characterization of semiconductors in solid or liquid, crystalline or amorphous, bulk or nanoscale form. With this chapter, we provide a brief introduction to XAS, covering both theory and experiment, while we refer to more comprehensive texts for greater detail about this continually evolvin...

Part 2 reviews the materials properties of photonic materials, such as structure (chemical bonds) and electrical conductivity (bands) in Group IV and III-V compound/alloy semiconductors. The correlation of the principal quantum number with optical, thermal and mechanical properties is examined. The definition of effective mass qualifies the energy-wavenumber dispersion relation for direct or in...

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