نتایج جستجو برای: electron contamination

تعداد نتایج: 359689  

2017
Jean-Nicolas Longchamp Tatiana Latychevskaia Conrad Escher Hans-Werner Fink

We investigated the utility of free-standing graphene as a transparent sample carrier for imaging nanometer-sized objects by means of low-energy electron holography. The sample preparation for obtaining contamination-free graphene as well as the experimental setup and findings are discussed. For incoming electrons with 66 eV kinetic energy, graphene exhibits 27% opacity per layer. Hence, electr...

2015
S. Di Mitri H.-S. Kang

Control of microbunching instability is a fundamental requirement in modern high brightness electron linacs, in order to prevent malfunction of beam optical diagnostics and contamination in the generation of coherent radiation, such as free electron lasers. We present experimental control and suppression of microbunching instabilityinduced optical transition radiation by means of particles’ lon...

2014
Lydia-Marie Joubert

For high-resolution visualization and image capturing of biological samples, the cleanliness of the high-vacuum imaging environment, including both instrument and sample surface, have become important aspects to ensure electron beam stability and high signal-to-noise ratios (SNR). Regular downstream plasma cleaning of both SEM chamber and specimen is required to ensure an uncontaminated instrum...

2012
Stav Zaitsev Oleg Shtempluck Eyal Buks

Electron beam induced deposition of amorphous carbon finds several uses in microlithography, surface micromachining, and the manufacturing of microand nanomechanical devices. This process also occurs unintentionally in vacuum chambers of electron microscopes and interferes with normal image acquisition by reducing resolution and causing charging effects. In this work, we show that the resonance...

2004
W. Lisowski

For the first time, both X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) techniques were applied in analysis of surface contamination of electrochemically etched Scanning Tunneling Microscope (STM) tungsten tips. Carbon monoxide, graphite, tungsten carbide and tungsten oxide were found as main surface contaminations of STM tungsten tips. The thickness of tungsten ox...

2013
R. Soufli M. Fernandez-Perea S. P. Hau-Riege S. L. Baker J. C. Robinson E. M. Gullikson J. D. Bozek N. M. Kelez S. Boutet Regina Soufli Mónica Fernández-Perea Stefan P. Hau-Riege Sherry L. Baker Jeff C. Robinson Eric M. Gullikson John D. Bozek Nicholas M. Kelez Sebastien Boutet

This manuscript presents a first study of the contamination observed on some of the x-ray mirrors for the Linac Coherent Light Source (LCLS) free-electron laser, the implications to the mirror lifetime properties and an evaluation of candidate techniques towards successful recovery of these B4Cand SiC-coated mirrors. Initial experimental results and plans for upcoming mirror recovery experiment...

Journal: :Applied radiation and isotopes : including data, instrumentation and methods for use in agriculture, industry and medicine 2016
D Stanga P De Felice J Keightley M Capogni E Ionescu

This paper is concerned with the modeling of the transmission of beta rays through thin foils in planar geometry based on the plane source concept, using Monte Carlo simulation of electron transport and least squares fitting. Applications of modeling results for calculating the efficiency of large-area beta sources, transmission coefficient of beta rays through thin foils and the beta detection...

Journal: :Nanoscale 2009
Eugenii U Donev J Todd Hastings

We demonstrate here the first focused electron-beam-induced deposition (EBID) of nanostructures using a liquid precursor. We have deposited sub-50 nm platinum (Pt) wires and dots from a dilute, aqueous solution of chloroplatinic acid. Existing EBID processes rely on the electron-beam stimulated decomposition of gaseous precursors; as a result, the deposits are highly contaminated (up to 75 at. ...

2014
Milos Toth FEI Company Charlene J. Lobo Ralph Knowles

Electron beam induced deposition EBID and etching EBIE are promising methods for the fabrication of three-dimensional nanodevices, wiring of nanostructures, and repair of photolithographic masks. Here, we study simultaneous EBID and EBIE, and demonstrate an athermal electron flux controlled transition between material deposition and etching. The switching is observed when one of the processes h...

Journal: :Gut 1978
A M Buchan J M Polak E Solcia C Capella D Hudson A G Pearse

Evidence was obtained by the use of alternate semithin-thin serial secretions for light and electron microsocpy that the I cell is the source of CCK PZ. The antibodies used were raised to a synthetic fragment of the mid part (9-20) of the (1-33) CCK-PZ molecule, and were thus free from any contamination with cross-reacting subpopulations of antibodies that might bind to gastrin.

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