This document discusses data flow testing: a form of structural (white box) testing that is a variant on path testing, focussing on the definition and usage of variables, rather than the structure of the program. Two different topics relating to data flow testing are discussed: define/use testing, along with a set of test coverage metrics; and the concept of splitting a program into slices, acc...

We propose a formal technique for automatic generation of tran­ sient fault detectors for flip-flops/latches in control logic. We apply GoldMine, an automatic assertion generation engine based on data mining and formal verification to generation of fault detectors. The GoldMine tool flow is modified to include fault coverage evalu­ ation of assertions. Our formal technique is sound and complete...

This paper presents a pulse response-based builtin self test technique and implementation for the testing of analog integrated circuits in mixed-signal systems. This BIST technique employs two narrow width pulses as input stimuli, and monitors two voltage samples on pulse response waveform for fault detection through allowable tolerances. The BIST system implementation realizes a programmable d...

It is well known that workload has significant impact on dependability measures obtained from fault injection experiments [3][5]. The effects on the outcome of fault injection experiments when the input data to be processed by the workload is altered, should also be considered [2]. To investigate the effects of workload input domain on fault injection results (e.g. error coverage), an experimen...

Adequacy criteria provide an objective measurement of test quality. Although these criteria are a major research issue in software testing, little work has been specifically targeted towards the testing of database-driven applications. In this paper, two structural coverage criteria are provided for evaluating the adequacy of a test suite for SQL queries that retrieve information from the datab...

In this paper, we discuss adjustable coverage criteria and their combinations in model-based testing. We formalize coverage criteria and specify test goals using OCL. Then, we propose a set of functions which describe the test generation process in a generic way. Each coverage criterion is mapped to a set of test goals. Based on this set of functions, we propose a generic framework enabling fle...

Test Coverage is a vital pointer of programming quality and a key piece of programming support. It helps in assessing the feasibility of testing by giving information on diverse coverage things. even though much research exertion has been put on the most proficient method to get possibility data by either code based testing or precondition based testing, very little has been paid to gauge and e...

2.Introduction VLSI yield and quality measured as defect-level and fault coverage are important concepts related to electronic production and testing. [1] Both of defect-level and fault coverage are wildly used in today’s test field. For VLSI chips, it’s necessary for manufacturer to make the tradeoff between the test cost and high fault coverage. Some defect chips will be shipped to the market...

Abstract−This paper describes a new redundant fault identification algorithm with Exclusive-OR circuit reduction. The experimental results using this algorithm with a FAN-based test pattern generation algorithm show nearly 100% fault coverage for complex arithmetic logic circuits. Moreover we achieved 99.99% fault coverage applying this algorithm with a weighted random pattern generator to the ...

This paper addresses the functional behavior of Cellular Neural Networks (CNN). The impact of variable convergence times on the proper operation of the network is discussed. A test method is presented to determine the functionality of the network. The function fault models assume that the cells are unable to switch between limiting states. The proposed method attains 100% stuck-at fault coverag...