نتایج جستجو برای: field scanning optical microscopy

تعداد نتایج: 1269983  

2006
Alessandro Salandrino Nader Engheta

Here we suggest and explore theoretically an idea for a far-field scanless optical microscopy with a subdiffraction resolution. We exploit the special dispersion characteristics of an anisotropic metamaterial crystal that is obliquely cut at its output plane, or has a curved output surface, in order to map the input field distribution onto the crystal’s output surface with a compressed angular ...

2016
Mingqian Zhang Tianying Wang

In this work, a metallic probe with a sharp tip and two half-circular nanostructures on its base is introduced and investigated. The proposed design aims at improving the detection performance of a probe for scattering scanning near-field optical microscopy in terms of enhanced signal-to-noise ratio. Under the premise of processing feasibility, the structure of the probe is designed and optimiz...

Journal: :Optics express 2009
C M Rollinson S M Orbons S T Huntington B C Gibson J Canning J D Love A Roberts D N Jamieson

Scanning Near-field Optical Microscopy (SNOM) is the leading instrument used to image optical fields on the nanometer scale. A metal-coating is typically applied to SNOM probes to define a subwavelength aperture and minimize optical leakage, but the presence of such coatings in the near field of the sample can often cause a substantial change in the sample emission properties. For the first tim...

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