نتایج جستجو برای: force measurement
تعداد نتایج: 619733 فیلتر نتایج به سال:
Various methods of force measurement with the atomic force microscope are compared for their ability to accurately determine the tip-surface force from analysis of the nonlinear cantilever motion. It is explained how intermodulation, or the frequency mixing of multiple drive tones by the nonlinear tip-surface force, can be used to concentrate the nonlinear motion in a narrow band of frequency n...
Photo-induced forces can be used to manipulate and cool the mechanical motion of oscillators. When the oscillator is used as a force sensor, such as in atomic force microscopy, active feedback is an enticing route to enhance measurement performance. Here we show broadband multimode cooling of -23 dB down to a temperature of 8 ± 1 K in the stationary regime. Through the use of periodic quiescenc...
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