High defect coverage requires good coverage of different fault types. In this paper, we present a comprehensive test vector generation technique for BIST, called Random Single Input Change (RSIC) generation, that can be used to generate tests for many arbitrary misbehaviors that can occur in digital systems, thus providing a single on-chip test generation solution. By proving the effectiveness ...

This paper presents an industrial case study on Built-In Self-Test for random logic (LBIST). The Self-testing Using MISR and Parallel SRSG (STUMPS) approach combined with multi-phase test point insertion (MTPI) has been evaluated on twenty-two industrial proven cores. The whole LBIST flow, including making cores LBIST ready and insertion of test points, has been investigated. The consequences w...

At-speed testing is becoming increasingly difficult with external testers as the speed of microprocessors approaches the GHz range. One solution to this problem is built-in self-test. However, due to their reliance on random patterns, current logic BIST techniques are not able to deal with large designs without adding high test overhead. In this paper, we propose a functional self-test techniqu...

This paper presents a logic BIST approach which combines deterministic logic BIST with test point insertion. Test points are inserted to obtain a first testability improvement, and next a deterministic pattern generator is added to increase the fault efficiency up to 100%. The silicon cell area for the combined approach is smaller than for approaches that apply a deterministic pattern generator...

A rapid growth of Machine-to-Machine (M2M) communications is expected in the coming years. M2M applications create new challenges for in-field testing since they typically operate in environments where human supervision is difficult or impossible. In addition, M2M networks may be significant in size. We propose to automate Logic Built-In Self-Test (LBIST) by using a centralized test management ...

A common approach for large industrial designs is to use logic built-in self-test (LBIST) followed by test data from an external tester. Because the fault coverage with LBIST alone is not sufficient, there is a need to top-up the fault coverage with additional deterministic test patterns from an external tester. This paper proposes a technique of combining LBIST and deterministic ATPG to form “...

This paper presents a new low power BIST TPG scheme for reducing scan transitions. It uses a transition freezing and melting method which is implemented of the transition freezing block and a MUX. When random test patterns are generated from an LFSR, transitions of those patterns satisfy pseudo-random Gaussian distribution. The proposed technique freezes transitions of patterns using a freezing...

At-speed testing of gigahertz processors using external testers may not be technically and economically feasible. Hence, there is an emerging need for low-cost high-quality self-test methodologies that can be used by processors to test themselves at-speed. Currently, built-in self-test (BIST) is the primary self-test methodology available. While memory BIST is commonly used for testing embedded...

We present X-tolerant deterministic BIST (XDBIST), a novel method to efficiently compress and apply scan patterns generated by automatic test pattern generation (ATPG) in a logic built-in self-test architecture. Our method allows test patterns to have any number of unknown values with no degradation in compression and application efficiency. XDBIST does not require changing the core logic of th...