X-ray diffraction (XRD) and electron backscatter diffraction (EBSD) are commonly used to perform texture analysis of thin films. However, due to principle differences in data acquisition these techniques can yield disagreeing results. In this paper, we aim to highlight possible error sources with given examples for aluminum and copper thin films. INTRODUCTION Texture in materials has a large in...

Innovative applications of the Rietveld method [1-3] are likely to include new developments in microstructure analysis. More and more samples show microstructure effects on line profile shape, width and position. Reasons are obviously the powder diffractometer resolution improvements at leading synchrotron sources, and the increasing user number. When the minimal full width at half maximum is a...

XRD1 was the first X-ray diffraction beamline to be built at the LNLS and after approximately 12 years of operation it was substantially updated to improve beam stability, increase the reliability of the monochromator movement as well as provide an experimental hutch that would meet the demands of users. The improvements included the construction of an independent concrete slab below the mirror...

The process of dynamical arrest, leading to formation of different arrested states such as glasses and gels, along with the closely related process of aging, is central for both basic research and technology. Here we report on a study of the time-dependent structural evolution of two aqueous Laponite clay suspensions at different weight concentrations. Neutron diffraction experiments have been ...

The existence of a quasi-liquid layer on the surface of ice crystals at temperatures not far belaw O°C is widely accepted on the basis of many experimental and theoretical studies (e.g., 1-4). However, there has been no experimental study including the direct information on, the structure of the quasi-liquid layer. It is therefore highly desirable to obtain structural data by X-ray diffraction ...

Abstract: Different thickness of Cu2S thin films were prepared by vacuum evaporation under a pressure of 10-6 torr at an evaporation rate of 3Å /sec. Cu2S has direct band gap energy and indirect band gap energy at 1.2eV and 1.8 eV respectively. This paper presents the analysis of structural and optical properties of the Cu2S thin film by X-ray diffractometer (XRD) and UV-Vis-NIR Spectrophotomet...