نتایج جستجو برای: ray photoelectron spectrum

تعداد نتایج: 517380  

2016
Y. Nunes G. Martins N. J. Mason D. Duflot S. V. Hoffmann J. Delwiche

The Open University's repository of research publications and other research outputs Electronic state spectroscopy of methyl formate probed by high resolution VUV photoabsorption, He(I) photoelectron spectroscopy and ab initio calculations Journal Article (2010). Electronic state spectroscopy of methyl formate probed by high resolution VUV photoabsorption, He(I) photoelectron spectroscopy and a...

Journal: :The Journal of chemical physics 2017
Julia H Lehman W Carl Lineberger

Anion photoelectron spectra of the thiazate (NSO-) and thionitrite (SNO-) isomers are reported. The NSO- photoelectron spectrum showed several well-resolved vibronic transitions from the anion to the NSO radical neutral. The electron affinity of NSO was determined to be 3.113(1) eV. The fundamental vibrational frequencies of NSO were measured and unambiguously assigned to be 1202(6) cm-1 (ν1, a...

Journal: :The Journal of chemical physics 2005
Weijun Zheng Shoujun Xu Dunja Radisic Sarah Stokes Xiang Li Kit H Bowen

Betaine is a permanent zwitterion. The molecular betaine anion has been generated in a hybrid, infrared desorption-electron photoemission source and its photoelectron spectrum recorded. The photoelectron spectrum of the betaine anion is characteristic of a dipole bound anion, and its vertical detachment energy was measured to be 0.29+/-0.03 eV. Calculations by Rak, Skurski, and Gutowski [J. Che...

Journal: :Journal of Physics B 2021

Abstract X-ray photoelectron spectroscopy (XPS) measures the binding energy of core-level electrons, which are well-localised to specific atomic sites in a molecular system, providing valuable information on local chemical environment. The technique relies measuring spectrum upon x-ray photoionisation, and resolution is often limited by bandwidth ionising pulse. This particularly problematic fo...

Journal: :Surface and Interface Analysis 2023

The inelastic scattering contribution to an X-ray photoelectron spectrum (XPS) reflects the distribution of elements within sample depth. Varying energy incident photons changes contribution. We present a standardless, automated method that exploits this change enable compositional analysis XPS information depth (also known as amount substance, AOS3λ). In method, intensities observed using two ...

Journal: :Bulletin of the Chemical Society of Japan 1976

Journal: :Bulletin of the Chemical Society of Japan 1975

Journal: :Journal of the Ceramic Society of Japan 1998

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