Internal Turn-Turn faults (TTF) are the most common failures in power transformers, which could seriously reduce their life expectancy. Although common protection schemes such as current-baseddifferential protection are able to detect some of the internal faults, some other minor ones (such as TTFs andshort circuit near the neutral point) cannot be detected by such schemes. Likewise, these rela...

changes in the physicochemical conditions of process unit, even under control, may lead to what are generically referred to as faults. the cognition of causes is very important, because the system can be diagnosed and fault tolerated. in this article, we discuss and propose an artificial neural network that can detect the incipient and gradual faults either individually or mutually. the main fe...

A study of the source-to-gate bridging faults at the transistor level in a CMOS circuit is presented in this brief paper. The manifestation of these faults depends on the resistance value of the connection causing the bridging. It has been shown that such faults manifest either as stuck-at or stuck-open faults and can be detected by tests for stuck-at and stuck-open faults generated for the equ...