A new method of obtaining Bragg reflection phases in an x-ray diffraction experiment is presented. It combines the phase-sensitive principles of multiple-beam diffraction and x-ray standing waves, and allows direct phase measurements of many multiple reflections simultaneously using a Bragg-inclined oscillating-crystal geometry. A modified-two-beam intensity function is devised to extract the p...

We show that X-ray scattering techniques can be used for the assessment of individual layer thicknesses inside complicated semi-conductor heterostructures dedicated to the opto-electronic domain. To this end, we propose methods to overcome two main drawbacks coming from: (1) the complexity of the X-ray profiles and, hence the difficulty to use model-dependent tools such as fitting procedures an...

We present a generalized method to describe the x-ray scattering intensity of the Bragg spots in a diffraction pattern from nanocrystals exposed to intense x-ray pulses. Our method involves the subdivision of a crystal into smaller units. In order to calculate the dynamics within every unit, we employ a Monte-Carlo-molecular dynamics-ab-initio hybrid framework using real space periodic boundary...