We report on the metalorganic vapor phase epitaxial (MOVPE) growth of AlN films on sapphire substrates. The effect of precursor flow rate and nucleation layer (NL) on the film quality was investigated. The films were characterized using AFM, XRD and PL. We could realize AlN films with very smooth surfaces and narrow symmetric XRD peaks indicating low screw/mixed type dislocation densities in th...

A test bench instrument constructed at MOXTEK, Inc. is capable of simultaneously capturing X-ray diffraction (XRD) and X-ray fluorescence (XRF) information using a charge-coupled device (CCD) as the X-ray detector. NASA is funding the instrument’s construction because of its low-power consumption and compact size; it could be used for in-situ planetary exploration missions for mineral analysis....

Porous clay heterostructures (PCH) based on modified montmorillonite were synthesized using different reaction conditions (different hydration degrees, pH values and reaction times). The PCH precursors and PCH were characterized using FTIR Spectroscopy and X-Ray Diffractions (XRD). The XRD results showed that basal distance of porous clay heterostructures was significantly influenced by the mod...

The spectroscopic studies of transition metal complexes of iron. metal complexes, are characterized by XRD, FTIR, H NMR, Mössbauer and VSM (vibrating sample magnetometer) measurements, are reported in the present paper. The XRD analysis reveals the crystalline nature of all the compounds. Mössbauer study interprets paramagnetic nature of complexes at room temperature. VSM measurements also reve...

A method of measuring biaxial stress-strain curves for sheet metal samples subjected to large plastic strains is described for one example aluminum alloy (AA 5754-O). The method uses a portable X-ray diffraction (XRD) system to measure in situ stresses during tensile deformations. Calibration of X-ray elastic constants and the effects of texture and intergranular stresses are discussed. Uniaxia...