نتایج جستجو برای: afm analysis
تعداد نتایج: 2833224 فیلتر نتایج به سال:
Atomic force microscopy (AFM) operates on a very different principle than other forms of microscopy, such as optical microscopy or electron microscopy. The key component of an AFM is a cantilever that bends in response to forces that it experiences as it touches another surface. Forces as small as a few picoNewtons can be detected and probed with AFM. AFM has become very useful in biological sc...
Atomic force microscopy (AFM) is a key tool of nanotechnology with great importance in applications to DNA nanotechnology and to the recently emerging field of RNA nanotechnology. Advances in the methodology of AFM now enable reliable and reproducible imaging of DNA of various structures, topologies, and DNA and RNA nanostructures. These advances are reviewed here with emphasis on methods utili...
Treatment with acifluorfen-methyl (AFM), methyl 5-(2-chloro-4-[tri-fluoromethyl] phenoxy)-2-nitrobenzoate, inhibited protochlorophyllide synthesis in dark-held, delta-amino levulinic acid-fed, excised cotyledons of cucumber (Cucumis sativus L.). Protochlorophyllide and protoporphyrin IX levels in AFM-treated cotyledons were inversely related and dependent on AFM concentration; as the herbicide ...
The present review analyses the recent literature on combined use of X-ray microscopy (XRM) and atomic force (AFM) for multiscale characterization Li + (or Li) batteries (LiBs) with aim developing guidelines their correlative analysis. usefulness XRM resides in capability affording non invasively situ images inner parts a LiB (an encapsulated device) spatial resolution dozens nm during operatio...
The spatial extent zeta(AFM) and strength J(AFM) of the antiferromagnetic (AFM) exchange coupling at buried Gd /Fe interfaces in ferrimagnetic [Gd(50 A)Fe(15,35 A)](15) sputtered multilayers is obtained from combined x-ray resonance magnetic reflectivity and magnetic circular dichroism measurements. zeta(AFM) is 4.1(7) A or approximately 1-2 interatomic distances in bulk Gd and Fe; J(AFM) is 10...
Nanoindentation is a popular experimental technique for characterization of the mechanical properties of soft and biological materials. With its force resolution of tens of pico-Newtons, the atomic force microscope (AFM) is well-suited for performing indentation experiments on soft materials. However, nonlinear contact and adhesion complicate such experiments. This paper critically examines the...
Frequency modulation atomic force microscopy (FM-AFM) experiments were performed on the calcite (10[Formula: see text]4) surface in pure water, and a detailed analysis was made of the 2D images at a variety of frequency setpoints. We observed eight different contrast patterns that reproducibly appeared in different experiments and with different measurement parameters. We then performed systema...
The frequency response of a cantilever beam is strongly dependent on the fluid in which it is immersed. In a companion study, Sader @J. Appl. Phys. 84, 64, ~1998!# presented a theoretical model for the flexural vibrational response of a cantilever beam, that is immersed in a viscous fluid, and excited by an arbitrary driving force. Due to its relevance to applications of the atomic force micros...
Magnetic and electric properties are investigated for the nanosized YMnO3 samples with different grain sizes (25 nm to 200 nm) synthesized by a modified Pechini method. It shows that magnetic and electric properties are strongly dependent on the grain size. The magnetic characterization indicates that with increasing grain size, the antiferromagnetic (AFM) transition temperature increases from ...
The copper nitride surface characteristics according to atmospheric pressure plasma (APP) and excimer ultraviolet (EUV) treatment were compared using XPS and AFM. As the result of XPS analysis result, in C1s, the organic material removal effect was greater for EUV treatment than for APP, and the oxygen content was found to be low. In Cu (933 eV) area, the shoulder peak of Cu compound was detect...
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