نتایج جستجو برای: atomic force microscopy afm
تعداد نتایج: 429884 فیلتر نتایج به سال:
Noncontact atomic force microscopy (nc-AFM), Kelvin probe force microscopy (KPFM) and first principle calculations show that the nanostructured (001) Suzuki surface of Cd(2+) doped NaCl can be used to confine the growth of palladium clusters and functionalized brominated pentahelicene molecules into only the Suzuki regions, which contain the impurities. The Suzuki surface is an ideal model surf...
Organized microstructures based on polyamidoamine dendrimers were created by using Single-Walled Carbon Nanotubes (SWNTs). Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM) showed that these patterns were characterized by straight and extended dendritic features. The formation of these shapes was attributed to a depletion mechanism induced by the SWNTs leading to the aggregat...
Thin films of copper indium diselenide (CIS) were prepared by chemical bath deposition technique onto glass substrate at 60C. The studies on composition, morphology, optical absorption, electrical conductivity and structure of the films were carried out. Characterization includes X-ray diffraction (XRD), Scanning electron microscopy (SEM), Atomic force microscopy (AFM), Energy dispersive x-ray ...
A simple electrochemical fabrication of graphene nanomesh (GNM) via colloidal templating is reported for the first time. The process involves the arraying of polystyrene (PS) spheres onto a CVD-deposited graphene, electro-deposition of carbazole units, removal of the PS template and electrochemical oxidative etching. The GNM was characterized by scanning electron microscopy (SEM), atomic force ...
Electrical charge-trapping characteristics have been studied in thermal oxides that were implanted with Si, experimentally using electron spin resonance (ESR), capacitance versus voltage (CV) measurements, transmission electron microscopy (TEM), atomic force microscopy (AFM), and theoretically with Density Functional Theory (DFT) using plane waves. Our study examines possible defect structures ...
Crystallization and melting in poly(ethylene oxide) are followed in real-time using hotstage atomic force microscopy (AFM). Hedritic morphology is observed at various stages of development. Lamellar growth rates are estimated and found to agree with values obtained by conventional optical microscopy. The presence of a depletion zone is detected at the crystal/melt interface.
The aim of this study was to evaluate the surface roughness of intraocular lenses (IOLs) generated by the manufacturing process and to determine the roughness parameters of 3D surface using atomic force microscopy (AFM). Intraocular lenses commercially available from a single manufacturer: Pharmacia & Upjohn Co. were investigated. Three intraocular lenses, model 911A CeeOn Edge, were analyzed o...
Atomic force microscopy (AFM) can be used in buffer, to image samples at a resolution superior to light-based microscopy techniques, and, unlike electron microscopy (EM), under physiological conditions [1]. However, the heterogeneity of most biological samples requires that, to distinguish specific components within a system, a label must be used. The lack of such labelling techniques for AFM m...
High-speed atomic force microscopy (HS-AFM) is now materialized. It allows direct visualization of dynamic structural changes and dynamic processes of functioning biological molecules in physiological solutions, at high spatiotemporal resolution. Dynamic molecular events unselectively appear in detail in an AFM movie, facilitating our understanding of how biological molecules operate to functio...
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