نتایج جستجو برای: fault coverage

تعداد نتایج: 148054  

2005
Doina Bein Wolfgang W. Bein Srilaxmi Malladi

We study the coverage problem from the fault tolerance point of view for sensor networks. Fault tolerance is a critical issue for sensors deployed in places where are not easily replaceable, repairable and rechargeable. The failure of one node should not incapacitate the entire network. We propose three 1 fault tolerant models, and we compare them among themselves, and with the minimal coverage...

Journal: :IEEE Trans. VLSI Syst. 1995
Krishnendu Chakrabarty John P. Hayes

We present a new test response compression method called cumulative balance testing (CBT) that extends both balance testing and accumulator compression testing. CBT uses an accumulated balance signature, and it guarantees very high error coverage (over 99%) for various error models. We demonstrate that the single stuck-line (SSL) fault coverage of CBT for many of the ISCAS 85 combinational benc...

2007
Wangqi Qiu

Fault Simulation and Test Generation for Small Delay Faults. (December 2006) Wangqi Qiu, B.S., Fudan University, China Chair of Advisory Committee: Dr. Duncan M. Walker Delay faults are an increasingly important test challenge. Traditional delay fault models are incomplete in that they model only a subset of delay defect behaviors. To solve this problem, a more realistic delay fault model has b...

Journal: :Automatica 2012
Matthias Albrecht Müller Alejandro D. Domínguez-García

In this paper, we propose an approach for modeling fault coverage in nonlinear dynamical systems. Fault coverage gives a measure of the likelihood that a system will be able to recover after a fault occurrence. In our setup, the system dynamics are described by a standard state-space model. The system input (disturbance) is considered to be unknown but bounded at all times. Before any fault occ...

2014
Neha Chaudhary

There are many challenges in testing of Graphical User Interface (GUI) applications due to its event driven nature and infinite input domain. Testing each and every possible combination of input require creating number of test cases to satisfy the adequacy criteria of GUI testing. It is not possible to test each and every test case within specified time frame. Therefore it is important to assig...

Journal: :IEEE Trans. Reliability 2002
Hairong Sun James J. Han Isaac Levendel

Conclusions In this paper, we investigate the availability requirement for the fault management server in high-availability communication systems. According to our study, we find that the availability of the fault management server does not need to be 99.999% in order to guarantee a 99.999% system availability as long as the fail-safe ratio (the probability that the failure of the fault managem...

2014
K.Ashok kumar

A new fault coverage test pattern generator using a linear feedback shift register (LFSR) called FC-LFSR can perform fault analysis and reduce the power of a circuit during test by generating three intermediate patterns between the random patterns by reducing the hardware utilization. The goal of having intermediate patterns is to reduce the transitional activities of Primary Inputs (PI) which ...

2004
G. Aubin T. Montalant J. Moulu F. Pirio J. - B. Thomine F. Devaux

filter output node and the other constitutes the additional observation point. Obviously, this point has to be judiciously chosen to be able to obtain an increase in fault coverage. So, the two analyser inputs are connected to (i) the output node of the fdter and (ii) the output node of the op-amp differential stage as shown in Fig. 2. The HSPICE fault simulations show that in this situation, o...

1999
PETER M. FOLKESSON Jan Torin

This thesis deals with the problem of validating and estimating the effectiveness of error handling mechanisms in computer systems. The main contribution is an assessment of the effectiveness and usefulness of several physical fault injection techniques. The assessment is based on fault injection experiments conducted on the fault-tolerant, distributed, real-time system MARS and the Thor microp...

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