An atomic force microscope (AFM) and spectrometer combined system for in-situ thickness measurement of nano-porous alumina (PA) films is introduced. The AFM is applied to obtain the porosity of PA film, and then we calculate the effective refractive index by Maxwell-Garnett effective dielectric constant theory. The optical thickness of PA film is determined by reflective interference spectromet...

Recently developed circularly polarized X-ray light sources can probe the ultrafast chiral electronic and nuclear dynamics through spatially localized resonant core transitions. We present simulations of time-resolved circular dichroism signals given by the difference of left and right circularly polarized X-ray probe transmission following an excitation by a circularly polarized optical pump w...

This paper reports the first experimental demonstration of an optically pumped electron spin filter. Unpolarized electrons produced in a cold-cathode discharge drift through a mixture of spin-polarized Rb and a nitrogen or helium buffer gas. Through spin-exchange collisions with the Rb, the drifting electrons become polarized along the optical pumping axis. We study the role of the buffer gas i...

The first results obtained with a new stand-alone atomic force microscope (AFM) integrated with a standard Zeiss optical fluorescence microscope are presented. The optical microscope allows location and selection of objects to be imaged with the high-resolution AFM. Furthermore, the combined microscope enables a direct comparison between features observed in the fluorescence microscope and thos...

This paper describes the development of a miniature, temperature-controlled, stainless steel pressure chamber which uses strain-free optical glass for windows. It is directly adaptable to standard phase-contrast and polarized-light microscopes and requires a minimum amount of equipment to generate and measure pressure. Birefringence retardation (BR) og 0.1 nm up to 3,000 psi, 0.4 nm up to 5,000...

A new type of scanning probe microscope, combining features of the scanning tunnelling microscope, the scanning tunnelling luminescence microscope with a transparent probe and the aperture scanning near-field optical microscope, is described. Proof-of-concept experiments were performed under ultrahigh vacuum conditions at varying temperature on GaAs/AlAs heterostructures.