نتایج جستجو برای: precipitation thick film optical property defect state

تعداد نتایج: 1484795  

Journal: :Materials Science in Semiconductor Processing 2014

1998
V. V. Nagarkar T. K. Gupta G. Entine

We are developing large-area, thick, structured CsI(Tl) imaging sensors for a wide variety of X-ray imaging applications. Recently we have fabricated structured CsI(Tl) scintillators ranging from 30 μm (16 mg/cm) to 2000 μm (900 mg/cm) in thickness and up to 15 x 15 cm in area. Even 2000-μm-thick film showed well-controlled columnar growth throughout the film. Material characterization confirme...

2014
Markos Tesfaye Charlotte Hanlon Fasil Tessema Martin Prince Atalay Alem Delmiro Fernandez-Reyes

BACKGROUND Common Mental Disorders (CMDs) are frequent among patients attending primary care. In Africa, CMDs are often misdiagnosed as physical illnesses because many of the patients complain of somatic symptoms of mental distress. We explored whether there was difference in the levels of CMD symptoms between patients with thick film confirmed and clinical cases of malaria with negative thick ...

Journal: :Journal of Physics: Conference Series 2007

Journal: :ElectroComponent Science and Technology 1977

2009
LEI KE DONGMEI JIANG XUEMING MA

High voltage gradient ZnO-based thick film varistors were fabricated by low-temperature sintering. The effect of sintering temperature on electrical properties of thick film varistors was investigated. The voltage gradient of thick film varistors increased significantly to 3159.4 V/mm after sintering at 725°C for 30 min. The small average grain size with good grain boundaries was the origin for...

Journal: :Computers & Industrial Engineering 2008
Young-Geun Yoon Seok-Lyong Lee Chin-Wan Chung Sang-Hee Kim

In this paper, we present an effective defect inspection system that identifies film defects and determines their types in order to produce polarized films for TFT-LCD (thin film transistor – liquid crystal display). The proposed system is designed and implemented to find defects from polarized film images using image segmentation techniques and to determine defect types through the image analy...

Journal: :Additional Conferences (Device Packaging, HiTEC, HiTEN, and CICMT) 2016

Journal: :ElectroComponent Science and Technology 1983

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