نتایج جستجو برای: testability
تعداد نتایج: 1426 فیلتر نتایج به سال:
This brief paper describes design-for-testability (DFT) circuitry that reduces testing time and thus cost of testing DC linearity of SAR ADCs. We present here the basic concepts, an actual SAR ADC chip design employing the proposed DFT, as well as measurements that verify its effectiveness. Since the DFT circuit overhead is small, it is practicable. key words: SAR ADC, testing, DC linearity, de...
In this paper we extend our understanding of the feasibility of testing BDI agent programs by analysing their testability with respect to the all edges test adequacy criterion, and comparing with previous work that considered the all paths criterion. Our findings extend the earlier analysis with respect to the all paths criterion to give a more nuanced understanding of the difficulty of testing...
Multilevel Logic Optimization Transformations used in existing logic synthesis systems are characterized with respect to their testability preserving and testability enhancing properties. A su cient condition for a multilevel unate circuit to be \hazard free delay fault testable" is presented. In contrast to existing results that consider either \single path propagating hazard free robust tests...
Testability issues of a core based system-on-a-chip (SOC) are identified and the various solutions available at the different stages of SOC evolution are discussed. It was found that a strategy at core level and system level is needed to achieve first time success of the core based SOC. The issues considered include area, power and delay overheads, Fault coverage, At speed test, Core transparen...
نمودار تعداد نتایج جستجو در هر سال
با کلیک روی نمودار نتایج را به سال انتشار فیلتر کنید