نتایج جستجو برای: testability

تعداد نتایج: 1426  

Journal: :IEICE Transactions 2011
Tomohiko Ogawa Haruo Kobayashi Satoshi Uemori Yohei Tan Satoshi Ito Nobukazu Takai Takahiro J. Yamaguchi Kiichi Niitsu

This brief paper describes design-for-testability (DFT) circuitry that reduces testing time and thus cost of testing DC linearity of SAR ADCs. We present here the basic concepts, an actual SAR ADC chip design employing the proposed DFT, as well as measurements that verify its effectiveness. Since the DFT circuit overhead is small, it is practicable. key words: SAR ADC, testing, DC linearity, de...

2016
Michael Winikoff

In this paper we extend our understanding of the feasibility of testing BDI agent programs by analysing their testability with respect to the all edges test adequacy criterion, and comparing with previous work that considered the all paths criterion. Our findings extend the earlier analysis with respect to the all paths criterion to give a more nuanced understanding of the difficulty of testing...

1993
Sreejit Chakravarty

Multilevel Logic Optimization Transformations used in existing logic synthesis systems are characterized with respect to their testability preserving and testability enhancing properties. A su cient condition for a multilevel unate circuit to be \hazard free delay fault testable" is presented. In contrast to existing results that consider either \single path propagating hazard free robust tests...

Journal: :IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 1987

2001
V. Ranganatha R. Sunda

Testability issues of a core based system-on-a-chip (SOC) are identified and the various solutions available at the different stages of SOC evolution are discussed. It was found that a strategy at core level and system level is needed to achieve first time success of the core based SOC. The issues considered include area, power and delay overheads, Fault coverage, At speed test, Core transparen...

Journal: :IEEE Transactions on Computers 1990

Journal: :The Annals of Statistics 2004

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