Attempts to commercialize GaN VCSELs have been unsuccessful to date due to the challenges of manufacturability of DBR mirrors, difficulties associated with current blocking, and the complexity of laser liftoff. The new process flow overcomes all three challenges enabling the manufacturing of IIINitride VCSEL without liftoff and with much reduced complexity and the possibility of on-wafer testing.

Attempts to commercialize GaN VCSELs have been unsuccessful to date due to the challenges of manufacturability of DBR mirrors, difficulties associated with current blocking, and the complexity of laser liftoff. The new process flow overcomes all three challenges enabling the manufacturing of IIINitride VCSEL without liftoff and with much reduced complexity and the possibility of on-wafer testing.

Parametric faults are a significant cause of incorrect operation in analog circuits. Many design for test techniques for analog circuits are ineffective at detecting multiple parametric faults because either their accuracy is poor, or the circuit is not tested in the configuration in which it is used. We present a design for test (DFT) scheme that offers the accuracy needed to test high-quality...

In this paper, we present an efficient low power scan test technique which simultaneously reduces both average and peak power consumption. The selective scan chain activation scheme removes unnecessary scan chain utilization during the scan shift and capture operations. Statistical scan cell reordering enables efficient scan chain removal. The experimental results demonstrated that the proposed...

Email was originally designed as a tool for asynchronous communication. However, as the number of messages increased, so did their variety. A wide range of new and unforeseen email tasks reflects this variety. One of the most commonly performed activities in email is management of pending tasks. This research focuses on how to support this activity in email and explores solutions that use diffe...

This paper proposes a simple and efficient model for designers to estimate fault coverage for partially testuble MCMs. This model relates fault coverage, test methodology. and the ratio and distribution of DFT dies (dies with design for testability features) in an MCM. Experimental results show that our model can eflciently predict the fault coverage of a partially testable MCM with less than 5...

Mathematical Word Problems (MWPs) are important for training students’ literacy and numeracy skills. Traditionally MWPs have been manually designed; an effective automated MWP generator can significantly benefit education and research. The goal of this work is to efficiently synthesize MWPs that are authentic (i.e., similar to manually written problems), diverse (i.e., covering a wide range of ...

Attempts to commercialize GaN VCSELs have been unsuccessful to date due to the challenges of manufacturability of DBR mirrors, difficulties associated with current blocking, and the complexity of laser liftoff. The new process flow overcomes all three challenges enabling the manufacturing of IIINitride VCSEL without liftoff and with much reduced complexity and the possibility of on-wafer testing.

More and more adolescents today are suffering from various adolescent stress. Too much stress will bring a variety of physical and psychological problems including anxiety, depression, and even suicide to the growing youths, whose outlook on life and problem-solving ability are still immature enough. Traditional face-to-face stress detection and relief methods do not work, confronted with adole...

Attempts to commercialize GaN VCSELs have been unsuccessful to date due to the challenges of manufacturability of DBR mirrors, difficulties associated with current blocking, and the complexity of laser liftoff. The new process flow overcomes all three challenges enabling the manufacturing of IIINitride VCSEL without liftoff and with much reduced complexity and the possibility of on-wafer testing.