نتایج جستجو برای: analog testing
تعداد نتایج: 388983 فیلتر نتایج به سال:
This paper describes a method of developing a Defect Oriented Test (DOT) strategy by using Inductive Fault Analysis (IFA) and layout dependent fault models extracted from process defect statistics. The results of a quantitative prediction of the effectiveness of several test strategies, such as functional, IDDQ, and a low voltage power supply method, on a current-mode Digital to Analogue Conver...
Clustering is an important technique in exploratory data analysis, with applications in image processing, object classiication, target recognition, data mining etc. The aim is to partition data according to natural classes present in it, assigning data points that are "more similar" to the same "cluster". We solved this ill-posed problem without making any assumptions about the structure of the...
conclusions this study does not support the use of emla for hsg. results there was no significant difference in the efficacy between emla and placebo creams in pain perception during the entire procedure. there was no significant difference in long term pain perception half an hour after the hsg performance. patients and methods eighty patients undergoing hsg as part of infertility evaluation w...
In this paper we propose an approach for testing time-domain properties of analog and mixed-signal circuits. The approach is based on an adaptation of a recently developed test generation technique for hybrid systems and a new concept of coverage for such systems. The approach is illustrated by its application to some benchmark circuits.
Day 1 Keynote:Greg Hinckley.EDAs Key to Success: Riding Waves of nnovation .................................... xii Day1 InvitedTalk1:ICQualification, Testing Manufacturing using Advanced Package offerings adequate process technologies ............................................................................................................................................. xiii Day1 Invited T...
In this paper, we propose a circuit that computes the area under a difference waveform and produces it's analog value as output. The transient waveforms pair from which the difference is computed is given as input to the circuit. The circuit is proposed as a hardware solution for a device testing technique called Transient Signal Analysis.
For an integrated free-space optical interconnection system we suggest the use of microprisms to achieve large coupling angles at low loss. Prisms were fabricated in photoresist and quartz glass by analog lithography. High-energy-beam-sensitive glass was used as the gray-tone mask. Optical testing of the prisms shows acceptable surface quality and high efficiency (95%).
Received, June 28, 2002. Accepted, October 18, 2002. OBJECTIVE: Programmable, multicontact, implanted stimulation devices represent an important advance in spinal cord stimulation for the management of pain. They facilitate the technical goal of covering areas of pain by stimulation-evoked paresthesiae. Adjustment after implantation requires major investments of time and effort, however, if the...
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