optically encoded information about processes in live cells. Atomic force microscopy, on the other hand, provides nanometer-resolved surface topography and mechanical information, and has recently been expanded to nanometerresolved live cell mechanical property mapping. The integration of the two advanced live cell imaging techniques into one tool, with the capability to acquire simultaneous na...

In situ atomic force microscopy reveals the morphology, surface topography, and growth and dissolution characteristics of microscopic single crystals of the low-dimensional organic conductor (tetrathiafulvalene)Br(0.76)' which are grown by electrocrystallization on a highly oriented pyrolytic graphite electrode in an atomic force microscope liquid cell. The growth modes and the distribution and...

A compact scanning force microscope has been developed for in situ combination with nanofocused X-ray diffraction techniques at third-generation synchrotron beamlines. Its capabilities are demonstrated on Au nano-islands grown on a sapphire substrate. The new in situ device allows for in situ imaging the sample topography and the crystallinity by recording simultaneously an atomic force microsc...

An atomic force microscope capable of obtaining images in less than 20 ms is presented. By utilizing a microresonator as a scan stage, and through the implementation of a passive mechanical feedback loop with a bandwidth of more than 2 MHz, a 1000-fold increase in image acquisition rate relative to a conventional atomic force microscope is obtained. This has allowed images of soft crystalline a...

An atomic force microscope was used to measure the loss tangent, tan , of a pressure-sensitive adhesive transfer tape as a function of frequency (0.01 to 10 Hz). For the measurement, the sample was oscillated normal to the surface and the response of the cantilever resting on the polymer surface (as measured via the photodiode) was monitored. Both oscillation amplitude and phase were recorded a...

We present a method for controlling the initiation and kinetics of polymer crystal growth using dip-pen nanolithography and an atomic force microscope tip coated with poly-dl-lysine hydrobromide. Triangular prisms of the polymer epitaxially grow on freshly cleaved mica substrates, and their in-plane and out-of-plane growth rates can be controlled by raster scanning the coated tip across the sub...

This article reports on the first successful combination of micro Laue (µLaue) diffraction with an atomic force microscope for in situ nanomechanical tests of individual nanostructures. In situ three-point bending on self-suspended gold nanowires was performed on the BM32 beamline at the ESRF using a specially designed atomic force microscope. During the bending process of the self-suspended wi...

During the past 20 years, the manipulation of atoms and molecules at surfaces has allowed the construction and characterization of model systems that could, potentially, act as building blocks for future nanoscale devices. The majority of these experiments were performed with scanning tunnelling microscopy at cryogenic temperatures. Recently, it has been shown that another scanning probe techni...