نتایج جستجو برای: atomic force microscopy thermal properties

تعداد نتایج: 1413518  

2008
Sergei Magonov

Introduction In the past two decades Atomic Force Microscopy (AFM) has been recognized as a powerful characterization method of surfaces at small scales and in different environments. In addition to high-resolution visualization of surface morphology and nanoscale structures, AFM microscopes are also broadly applied for examination of mechanical, electromagnetic, optical and other properties. T...

2004
A. Yu. Emelyanov

General energy approaches have been applied to study the single-domain polarization reversal induced by the voltage-modulated Atomic Force Microscopy (AFM) in ferroelectric single crystals and thin films. Topographic analysis of energy surfaces in the subspace of domain dimensions is performed, and energy evolutions under an external bias are elucidated. This has let to successfully describe al...

Journal: :Physical chemistry chemical physics : PCCP 2014
Zhi Guo Doyun Lee Yi Liu Fangyuan Sun Anna Sliwinski Haifeng Gao Peter C Burns Libai Huang Tengfei Luo

Thermal transport is critical to the performance and reliability of polymer-based energy devices, ranging from solar cells to thermoelectrics. This work shows that the thermal conductivity of a low band gap conjugated polymer, poly(4,8-bis-alkyloxybenzo[1,2-b:4,5-b']dithiophene-2,6-diyl-alt-(alkylthieno[3,4-b]thiophene-2-carboxylate)-2,6-diyl) (PBDTTT), for photovoltaic applications can be acti...

2015
Aaron J. Schmidt Ramez Cheaito Matteo Chiesa

Frequency-domain thermoreflectance is extended to the characterization of thin metals films on low thermal diffusivity substrates. We show how a single noncontact measurement can yield both the thickness and thermal conductivity of a thin metal film with high accuracy. Results are presented from measurements of gold and aluminum films 20–100 nm thick on fused silica substrate. The thickness mea...

Journal: :Proceedings of the National Academy of Sciences of the United States of America 2010
Lynda Cockins Yoichi Miyahara Steven D Bennett Aashish A Clerk Sergei Studenikin Philip Poole Andrew Sachrajda Peter Grutter

Strong confinement of charges in few-electron systems such as in atoms, molecules, and quantum dots leads to a spectrum of discrete energy levels often shared by several degenerate states. Because the electronic structure is key to understanding their chemical properties, methods that probe these energy levels in situ are important. We show how electrostatic force detection using atomic force m...

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