In the search for alternatives to obtain more information from rock tests and make them accessible, this study applies Digital Image Correlation technique (DIC 2D) in a diametral compression test called Brazilian Test, comparing result measured by an extensometer with obtained DIC. Rock provide about characteristics applicable several engineering areas, such as mining construction. using strain...

The overall throughput of automatic test equipment (ATE) is sensitive to the download time of test data. An effective approach to the reduction of the download time is to compress test data before the download. The authors introduced a test data compression method which outperforms other methods for compressing test data [8]. Our previous method is based on the Burrows-Wheeler transformation on...

One of the major challenges in testing a system-on-a-chip (SoC) is dealing with the large test data volume and large scan power consumption. To reduce the volume of test data, several test data compression techniques have been proposed. This paper presents a new test data compression scheme, which reduces test data volume for a system-on-a-chip (SoC). The proposed approach is based on the use o...

An important organization for built-in self-test of VLSI circuits uses complete or psuedorandom test input generators followed by output data reduction. Two compression techniques which have been used are polynomial division (signature) and ones counting (syndrome). The simultaneous use of both of these approaches in parallel is investigated. Analytic and enumerative results indicate that the n...

BACKGROUND The reported accuracy of clinical tests for superior labral anterior posterior lesions is extremely variable. Pooling results from multiple studies of higher quality is necessary to establish the best clinical tests to use. HYPOTHESIS Certain clinical tests are superior to others for diagnosing the presence or absence of a superior labral anterior posterior lesion. STUDY DESIGN M...

Test compression / decompression scheme for reducing the test application time and memory requirement of an LSI tester has been proposed. In the scheme, the employed coding algorithms are tailored to a given test data, so that the tailored coding algorithm can highly compress the test data. However, these methods have some drawbacks, e.g., the coding algorithm is ineffective in extra test data ...