Abstract The temperature dependence of the optical constants materials (refractive index, absorption and extinction coefficients, dielectric function) can be determined with spectroscopic ellipsometry over a broad range temperatures photon energies or wavelengths. Such results have practical value, for example applications at cryogenic elevated temperatures. gaps their broadenings also provides...

First applications of ellipsometry to the measurement of polyand nanocrystalline thin films date back to many decades. The most significant step towards the ellipsometric investigation of composite thin films was the realization of the first spectroscopic ellipsometers in the ’70s [3, 4, 8], which allowed the measurement of the dielectric function, the imaginary part of which is directly relate...

Fabio Antonio Bovino1, Maria Cristina Larciprete2, Concita Sibilia2 Maurizio Giardina1, G. Váró3 and C. Gergely4 1Quantum Optics Lab Selex-Sistemi Integrati, Genova, Italy 2Department of Basic and Applied Sciences in Engineering, Sapienza University, Rome, 3Institute of Biophysics, Biological Research Center, Hungarian Academy of Sciences, Szeged, 4Montpellier University, Charles Coulomb Labora...

A polypeptide nanofilm made by layer-by-layer (LbL) self-assembly was built on a surface that mimics nonwoven, a material commonly used in wound dressings. Poly-L-lysine (PLL) and poly-L-glutamic acid (PLGA) are the building blocks of the nanofilm, which is intended as an enzymatically degradable lid for release of bactericides to chronic wounds. Chronic wounds often carry infection originating...

A polyethylenimine (PEI) self-assembled monolayer (SAM) is prepared, capable of complexing silver and copper cations and of anchoring silver nanoparticles, exerting antibacterial activity against Escherichia coli and Staphylococcus aureus. Functionalized glassy surfaces have been fully characterized through spectroscopic techniques (UV-Vis spectroscopy, spectroscopic ellipsometry), atomic force...

The thickness and spectral dependence of the complex refractive index of upper layer in thin-film MBE-grown GaAs heterostructures were calculated basing on a classical oscillatory model of dielectric function from spectra measured by spectroscopic ellipsometry (nondestructive, contactless optical method) in the range of 1.5-4.75 eV.