نتایج جستجو برای: environmental impact
تعداد نتایج: 1085561 فیلتر نتایج به سال:
Journal:
:Microelectronics Reliability
2010
Bo-Chin Wang
Ting-Kuo Kang
San-Lein Wu
Shoou-Jinn Chang
Process-induced strain dependence of impact ionization efficiency (IIE) in nMOSFETs with a tensile contact etch stop layer (CESL) is presented for the first time. From the universal relationship between the IIE and the electric field in the pinch-off region, a difference in the IIE of nMOSFETs between without and with the tensile CESL is found. This result can be mainly attributed to the narrow...
Journal:
:Journal of Life Cycle Assessment, Japan
2011
Journal:
:Southern African Journal of Anaesthesia and Analgesia
2011
Journal:
:TATuP - Zeitschrift für Technikfolgenabschätzung in Theorie und Praxis
1996
Journal:
:The Japanese Journal of Real Estate Sciences
2013
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