Helium ion microscopy has recently emerged as a potent tool for the in-situ modification and imaging of nanoscale devices. For example; finely focused helium ion beams have been used for the milling of pores in suspended structures. We here report the use of helium ion milling for the post-fabrication modification of nanostrings machined from an amorphous SiCN material. The modification consist...

the price of single point diamond tools with a sharp tip is very high due to complex machining process and highly expensive machining equipments. yet, the performance is not quite satisfactory. in this paper, we have presented a very simple and cost effective machining process for the sharpening and polishing of diamond stylus using low energy reactive ion beam machining (ribm). in our method, ...

Abstract Focused ion beam (FIB) milling is an increasingly popular technique for fabricating micro-sized samples nanomechanical characterization. Previous investigations have cautioned that exposure to a gallium can significantly alter the mechanical behavior of materials. In present study, effects gallium, neon, and xenon ions are scrutinized. We demonstrate fracture toughness measurements on ...

In the cerebral cortex, most synapses are found in the neuropil, but relatively little is known about their 3-dimensional organization. Using an automated dual-beam electron microscope that combines focused ion beam milling and scanning electron microscopy, we have been able to obtain 10 three-dimensional samples with an average volume of 180 µm(3) from the neuropil of layer III of the young ra...

Novel fabrication, detection and analysis approaches were employed to experimentally demonstrate scattering reduction by a plasmonic nanostructure operating at 1550 nm. The nanostructure consisted of a silicon nanorod surrounded by a plasmonic metamaterial cover comprised of eight gold nanowires and was fabricated by a combination of electron beam lithography, focused ion beam milling and dry a...

It has been demonstrated that the mechanical properties of materials change significantly when external dimensions are confined to the nanoscale. Currently, the dominant fabrication method for mechanical testing specimens with nanometer dimensions is by using focused ion beam (FIB) milling, which results in inevitable Ga(+) induced damage to the microstructure. Here, we report a FIB-less fabric...