نتایج جستجو برای: low energy electron diffraction

تعداد نتایج: 2016027  

Journal: :Acta Crystallographica Section A Foundations and Advances 2018

Nanocrystalline cadmium sulfide thin films as antireflection materials for solar cells have been prepared by a new chemical solution deposition route in an aqueous medium at 50 °C. as-deposited thin films were studied using X-ray diffraction (XRD), field emission scanning electron microscopy (FE-SEM), and optical absorption spectra. X-ray diffraction data indicated the formation of hexagonal na...

Journal: :Physical review letters 2004
D Sander W Pan S Ouazi J Kirschner W Meyer M Krause S Müller L Hammer K Heinz

A reversible switching of the easy axis of magnetization for Ni on Cu(001) from in plane to out of plane is found by changing the partial pressure of hydrogen in the gas phase around the sample, allowing even for oscillations of the magnetization direction. A quantitative low-energy electron diffraction study of the diffracted intensity versus electron energy [I(E)] shows that the hydrogen-indu...

2013

this review describes the Auger Electron Spectroscopy (AES), Low Energy Electron Diffraction (LEED), Raman Spectroscopy & Field Ion Microscopy (FIM) techniques for materials characterization at the atomic and molecular level along with composition, and vibration frequencies of a substance. The goal is to provide an overview of the utilization of these instrumental methods for analyzing the surf...

Journal: :Physical review letters 2013
K L Man M C Tringides M M T Loy M S Altman

Mass transport in the Pb wetting layer on the Si(111) surface is investigated by observing nonequilibrium coverage profile evolution with low energy electron microscopy and microlow energy electron diffraction. Equilibration of an initial coverage step profile occurs by the exchange of mass between oppositely directed steep coverage gradients that each move with unperturbed shape. The bifurcati...

2004
M. S. Chen A. K. Santra D. W. Goodman

Ultra-thin SiO2 films were prepared by evaporating Si onto a Mo~112! surface followed by oxidation and annealing up to 1200 K. The surface structure and film quality were investigated by low-energy electron diffraction ~LEED!, Auger spectroscopy ~AES!, and high-resolution electron energy loss spectroscopy ~HREELS!. A well-ordered, monolayer Mo(112)-c(232)-SiO2 structure was characterized by HRE...

1996
C. Xu W. S. Oh

Layered, binary thin-film oxides of NiO, MgO and CaO have been prepared and characterized using low energy electron diffraction, Auger electron spectroscopy, energy loss spectroscopy, ion scattering spectroscopy, and temperature programmed desorption using probe molecules. Epitaxial growth was observed for the NiO–MgO and CaO–NiO systems; however, superior wetting was found for NiO–MgO relative...

SnCl4/nano-sawdust was prepared as a carbohydrate-based catalyst containing of tin bearing cellulose units. The catalyst was characterized by X-ray diffraction (XRD), fourier transform infrared spectroscopy (FT-IR), field emission scanning electron microscopy (FESEM) and energy dispersive X-ray spectroscopy (EDS). The catalyst was applied successfully as a readily available, inexpensive, biodeg...

1997
A. Wiessner

We designed and built a combination of a scanning tunneling microscope ~STM! and a scanning electron microscope ~SEM! which is working under ultrahigh vacuum conditions ~base pressure typically 7 • 10 mbar!. The SEM is ideally used for surveying the sample and to control the STM tip positioning, while the STM extends the resolution range into the atomic scale. The design concept allows moving t...

2001
Jason T. Drotar B. Q. Wei Y.-P. Zhao G. Ramanath P. M. Ajayan T.-M. Lu G.-C. Wang

Using reflection high-energy electron diffraction, we have observed diffraction patterns from both vertically aligned and randomly oriented multiwalled carbon nanotube samples. The patterns, for both samples, consist of rings and are similar to the patterns observed in x-ray diffraction from multiwalled carbon nanotubes. The ring radii are roughly consistent with powder diffraction from graphit...

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