نتایج جستجو برای: scattering ellipsometry
تعداد نتایج: 116656 فیلتر نتایج به سال:
of CrBN films deposited by ion beam assisted deposition" (2002). This article reports on the growth and analysis of CrBN nanocrystalline materials using an ion beam assisted deposition process. In addition, this article addresses the utilization of spectroscopic ellipsometry for in situ analysis of ternary nitrides. Coatings, with a total thickness of 1.5 Ϯ0.2 m, were deposited at low temperat...
Ba1-xGdxTiO3 thin films have been fabricated at different Gd3+ ionic concentrations, film thicknesses, and annealing temperatures using the sol-gel method. The refractive index of on a silicon substrate is characterized Spectroscopic Ellipsometry (SE), where ellipsometry angles Ψ Δ are fitted very well with Cauchy dispersion model. results show that 632.8 nm decreases from 2.18 to 1.892 increas...
We describe a sensitive method for measuring time-dependent changes in refractive index within approximately 5 microm of an interface using off-null time-resolved ellipsometry and a dual-cavity femtosecond laser. The sensitivity to changes in refractive index is two orders of magnitude higher than conventional picosecond interferometry. A thin metal film on a sapphire substrate is heated by app...
Pulsed laser deposited tetrahedral amorphous carbon with high sp3 fractions and low optical bandgaps
Amorphous carbon films with sp3 bonded carbon fractions over 70% are deposited by pulsed laser deposition. However, the optical bandgap obtained from optical transmittance and spectroscopic ellipsometry analysis shows the values to be below 1.0 eV. A wide range of measurements such as electron energy loss spectroscopy, visible Raman, spectroscopic ellipsometry, optical transmittance, and electr...
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