نتایج جستجو برای: test equipment

تعداد نتایج: 879736  

2003
Ahmad A. Al-Yamani Edward J. McCluskey

Reseeding is used to improve fault coverage in pseudo-random testing. Most of the work done on reseeding is based on storing the seeds in an external tester. Besides its high cost, testing using automatic test equipment (ATE) makes it hard to test the circuit while in the system. In this paper, we present a technique for built-in reseeding. Our technique requires no storage for the seeds. The s...

Journal: :IEEE Trans. on CAD of Integrated Circuits and Systems 2012
Lung-Jen Lee Wang-Dauh Tseng Rung-Bin Lin Cheng-Ho Chang

This paper presents a pattern run-length compression method. Compression is conducted by encoding 2 runs of compatible or inversely compatible patterns into codewords in both views either inside a single segment or across multiple segments. With the provision of high compression flexibility, this method can achieve significant compression. Experimental results for the large ISCAS’89 benchmark c...

2005
Olivia Nemethova Michal Ries Antitza Dantcheva Stefan Fikar

In this article we discuss the suitability of various equipment types used to capture the user’s subjective perceptual quality evaluation for video streams with time-variant quality. We present four basic types of testing equipment (mouse, joystick, throttle and sliding bar). Since method and equipment used for testing must not influence the test results, we analyzed the requirements for the te...

Journal: :DEStech Transactions on Computer Science and Engineering 2021

Journal: :TRANSACTIONS OF THE JAPAN SOCIETY OF MECHANICAL ENGINEERS Series A 1996

Falaki, Mohsen ,

Abstract: In this paper, a generalized Lagrangian-based algorithm (TRALM) and gravitational search algorithm (GSA) are used to solve the Optimal Load Distribution Problem (OPF) in the presence of FACTS equipment. Four TCSC, TCPST UPFC and SVC equipment’s have been tested. Modeling of FACTS equipment is based on power injection method. To optimally manage production, losses and voltage profiles,...

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