The survivability of microelectronic devices in ionizing radiation environments drives spacecraft design, capability, mission scope, and cost. This article exploits the periodic nature many space to extend device lifetimes without additional shielding or modifications semiconductor architecture. We propose a technique for improving component through reduced total-dose accumulation by modulating...

background: to suggest south india ct diagnostic reference levels (drls) by collecting radiation doses for the most commonly performed ct examinations. materials and methods: a pilot study investigated the most frequent ct examinations. 110 ct sites were asked to complete a survey booklet to allow the recording of ct parameters for each of 3 ct examinations during a 1 year time period. dose dat...