Attempts to commercialize GaN VCSELs have been unsuccessful to date due to the challenges of manufacturability of DBR mirrors, difficulties associated with current blocking, and the complexity of laser liftoff. The new process flow overcomes all three challenges enabling the manufacturing of IIINitride VCSEL without liftoff and with much reduced complexity and the possibility of on-wafer testing.

in the ordinary linear models, regressing the residuals against lagged values has been suggested as an approach to test the hypothesis of zero autocorrelation among residuals. in this paper we extend these results to the both equally and unequally replicated functionally measurement error models. we consider the equally and unequally replicated cases separately, because in the first case the re...

this lecture introduces testing methods for the protection of children in vehicles. in order to reduce the fatalities and injuries of children in transportation state of the art child protection is mandatory. global laws and regulations such as ece or fmvss are introduced and compared with new car assessment programs (ncap). engineering tools and equipment to test according to global child prot...

Attempts to commercialize GaN VCSELs have been unsuccessful to date due to the challenges of manufacturability of DBR mirrors, difficulties associated with current blocking, and the complexity of laser liftoff. The new process flow overcomes all three challenges enabling the manufacturing of IIINitride VCSEL without liftoff and with much reduced complexity and the possibility of on-wafer testing.

This paper describes the results of an exploratory study of blanket concepts based on SiC/SiC structure and LiPb breeder. An assessment of the performance of these concepts for advanced power plant application i s presented, key issues are identified, and constraints relating to the SiC/SiC properties are discussed.

A novel design-for-test (DFT) technique is presented for designing a core with a “virtual scan chain” which looks (to the system integrator) like it is shorter than the real scan chain inside the core. The I/O pins of a core with a virtual scan chain are identical to the I/O pins of a core with a normal scan chain. For the system integrator, testing a core with a virtual scan chain is identical...

In this paper episodic reports of feelings are analyzed to explore the correlation with activity and travel characteristics, personal and household circumstances as well as other contextual factors that may influence feelings. Interestingly, a strong correlation is found between global indicators of satisfaction about life, health, and finances and discrepancies with marriage satisfaction. In a...

Creativity is an important predecessor of any innovation and a competitive factor in many industries. However, only little is known about the management of business processes that are coined by creativity. The theory of managing creativity-intensive processes provides an analytical perspective for the understanding and management of these processes. Consulting processes, at first sight, seem no...

This paper presents a Design-for-Test (DfT) approach for folded ADCs. A sensor DfT circuit is designed to sample several internal ADC test points at the same time, so that, by computing the relative deviation among them the presence of defects can be detected. A fault evaluation is done considering a behavioral model to compare the coverage of the proposed test approach with a functional test. ...