نتایج جستجو برای: analog simulation

تعداد نتایج: 607875  

2012
Rajeev Narayanan

A Framework for Noise Analysis and Verification of Analog Circuits Rajeev Narayanan, Ph.D. Concordia University, 2012 Analog circuit design and verification face significant challenges due to circuit complexity and short market windows. In particular, the influence of technology parameters on circuits, noise modeling and verification still remain a priority for many applications. Noise could be...

Journal: :Clinical chemistry 1985
T A Wilkins J E Midgley N Barron

The basic theory of thyroxin-analog-based radioimmunoassays for free thyroxin has been extended to evaluate definitively the effects arising from residual binding of the tracer analog to serum proteins. Using experimentally determined binding constants and computer simulation techniques, we studied the effects of thyroxin-analog binding to serum proteins on results of Amerlex FT4 radioimmunoass...

Journal: :JOURNAL OF INFORMATICS AND TELECOMMUNICATION ENGINEERING 2021

2004
Tamal Mukherjee Richard Carley

A rapid yield estimation methodology that aids the analog circuit designer in making design trade-offs that improve yield is presented. This methodology is based on using hierarchical evaluation of analysis equations, rather than simulation, to predict circuit performance. The new analog rapid yield estimation (ARYE) method has been used to predict the yield of two-stage op amps, and has been i...

2017
Vinicius M. Lima Gustavo C. Amaral Felipe Calliari Guilherme P. Temporão Jean Pierre von der Weid Joaquim D. Garcia João Pedro Garcia

We present a complete optoelectronic unit for polarization visualization, switching and control. The system is based on a Field Programmable Gate Array (FPGA) unit and comprises: an acquisition unit containing an analog polarimeter and digital-to-analog converters; an FPGA capable of implementing an optimal algorithm for three-stage arbitrary polarization tracking; and an electronic driver with...

1998
Linda S. Milor

Traditionally, work on analog testing has focused on diagnosing faults in board designs. Recently, with increasing levels of integration, not just diagnosing faults, but distinguishing between faulty and good circuits has become a problem. Analog blocks embedded in digital systems may not easily be separately testable. Consequently, many papers have been recently written proposing techniques to...

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