نتایج جستجو برای: atomic force
تعداد نتایج: 258557 فیلتر نتایج به سال:
Level 1—General training (1 month) to provide the ardiovascular trainee with a working knowledge of CMR ethods and diagnostic utility. Level 2—Specialized training (at least 3 months) deigned to provide fellows with the skills necessary to ndependently interpret CMR imaging studies. Level 3—Advanced training for those who ultimately ish to be responsible for the operation of a CMR laboraory. Le...
Johannes H. Kindt Jackie A. Cutroni Dr. Thomas Gutsmann Professor Paul K. Hansma Department of Physics University of California Santa Barbara, CA 93106, USA Email: [email protected]
The role of the cantilever in quantitative Kelvin probe force microscopy (KPFM) is rigorously analyzed. We use the boundary element method to calculate the point spread function of the measuring probe: Tip and cantilever. The calculations show that the cantilever has a very strong effect on the absolute value of the measured contact potential difference even under ultra-high vacuum conditions, ...
In this article, we present a deflection measurement setup for Atomic Force Microscopy (AFM). It is based on a quadrature phase differential interferometer: we measure the optical path difference between a laser beam reflecting above the cantilever tip and a reference beam reflecting on the static base of the sensor. A design with very low environmental susceptibility and another allowing calib...
S ORAL PRESENTATIONS X-ray Fluorescence microscopy and micro-spectroscopy: Multidisciplinary tools
Noncontact atomic force microscopy (NC-AFM) is being increasingly used to measure the interaction force between an atomically sharp probe tip and surfaces of interest, as a function of the three spatial dimensions, with picometer and piconewton accuracy. Since the results of such measurements may be affected by piezo nonlinearities, thermal and electronic drift, tip asymmetries, and elastic def...
The effect of disorder on polarization switching in ferroelectric materials is studied using piezoresponse force microscopy in a liquid environment. The spatial extent of the electric field created by a biased tip is controlled by the choice of medium, resulting in a transition from localized switching dictated by tip radius, to uniform switching across the film. In the localized regime, the fo...
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