one of important problems in supply chains management is supplier selection. in a company, there are massive data from various departments so that extracting knowledge from the company’s data is too complicated. many researchers have solved this problem by some methods like fuzzy set theory, goal programming, multi objective programming, the liner programming, mixed integer programming, analyti...

‎selecting the most suitable robot among their wide range of specifications and capabilities is an important issue to perform the hazardous and repetitive jobs‎. ‎companies should take into consideration powerful group decision-making (gdm) methods to evaluate the candidates or potential robots versus the selected attributes (criteria)‎. ‎in this study‎, ‎a new gdm method is proposed by utilizi...

The influence of perceived quality is a classic problem in vendor selection process. To overcome this problem, many algorithms have been used decision making. In paper we carried out the identification planning team needs and optimization bidding scheme using key requirements to minimize perceptions. Kano Model Analysis method, Analytical Hierarchy Process Technique for Order Preference by Simi...

The problem in which a firm has to meet the c.emand for the services of several distinct but related equipment over a planning horizon is considered. An equipment of one type can be converted into an equipment of the other type at some costs. Hence demands may be met by direct capacity installation (expansion) or by converSiLQn from another type of eqUl.pment. Capacity installation and conversi...

The supplier selection process attracted a lot of attention in the business management literature. This process takes into consideration several quantitative and qualitative variables and is usually modeled as a multi-attribute decision making (MADM) problem. A recognized shortcoming in the literature of classical MADM methods is that they don’t permit the identification of interdependencies am...

The increasing test data volume required to ensure high test quality when testing a System-on-Chip is becoming a problem since it (the test data volume) must fit the ATE (Automatic Test Equipment) memory. In this paper, we (1) define a test quality metric based on fault coverage, defect probability and number of applied test vectors, and (2) a test data truncation scheme. The truncation scheme ...